Atomic force microscope for examining sample, has evaluation unit receiving measurement variable i.e. friction between probe tip and sample, as input besides force reciprocal effect for determining artifact

Simple SummaryContent extracted from patent full text and abstract with AI.

This patent describes an atomic force microscope (AFM) equipped with a system that measures both the normal force and the friction (lateral force) between the probe tip and the sample surface. The added ability to analyze friction as a measured variable, alongside force interactions, allows the system to better identify and correct artifacts (errors or distortions) in imaging and data collection during microscopy.

Use CasesContent extracted from patent full text and abstract with AI.

• High-precision surface analysis in materials science to distinguish between genuine surface features and imaging artifacts.
• Quality control in microelectronics manufacturing, ensuring that observed anomalies are not measurement artifacts.
• Biological research where subtle differences in cell surface friction could be significant, aiding in distinguishing actual characteristics from instrument-induced errors.
• Nanotechnology research, improving the reliability of AFM-based measurements.

BenefitsContent extracted from patent full text and abstract with AI.

• Provides more accurate and reliable AFM measurements by distinguishing real features from artifacts.
• Enables improved analysis of surface properties, including both force and friction.
• Enhances quality of scientific data in various research and industrial applications.
• Potentially reduces misinterpretation of data caused by artifacts, saving time and resources.

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Patent Abstract

The microscope has a probe with a tip, and a scanning unit for relative positioning of the tip and sample to be examined. A detector measures the force reciprocal effect between the tip and the sample, and a measurement device determines the friction between the tip and the sample. An evaluation unit receives measurement variable as an input besides the force reciprocal effect for determining the artifact, where the measurement variable is the friction between the tip and the sample.