Magnetization Device for an Electron Microscope and Method

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This invention relates to a specialized magnetization device used with electron microscopes. The device features a yoke (a magnetic core) with coils and gaps that generate adjustable magnetic fields at a sample holder's location, while minimizing heating and allowing precise placement and examination of magnetic samples. Its novel structure ensures accurate magnetic field exposure to samples without affecting electron microscope operation or causing sample heating, and supports easy sample handling and rotation for advanced analysis.

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• Studying the magnetic properties of materials in high-resolution transmission electron microscopy (HRTEM).
• Analyzing samples for magnetic storage media development and quality testing.
• Performing advanced research on materials where precise control of the magnetic environment is required (e.g., spintronics, nanomagnetism, quantum materials).
• Characterizing samples under specific magnetic field orientations and strengths without inducing thermal artifacts.
• Integrating with other analytical instruments (such as X-ray diffraction or neutron scattering devices) to study material behavior in controllable magnetic fields.
• Enabling cooling-sensitive or low-temperature experiments by minimizing heat transfer to samples.

BenefitsContent extracted from patent full text and abstract with AI.

• Reduces unwanted heating of samples during magnetic field application, protecting sensitive or temperature-dependent materials.
• Allows for precise adjustment and control of magnetic field strength and orientation at the sample position.
• Minimizes undesired electron beam deflection and optical artifacts in electron microscopes by maintaining field locality and providing counter-fields if necessary.
• Enables easy and accurate placement of tiny samples using optical microscopy due to the separable device structure.
• Facilitates sample rotation relative to both the electron beam and magnetic field for detailed angular studies.
• Compact design fits within the limited space inside standard electron microscopes, making the solution broadly compatible.
• Promotes better-quality imaging and measurement results by maintaining thermal and mechanical stability during analysis.

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Inventors & Applicants

Patent Abstract

The invention refers to a Magnetization device (1, 11) for an electron microscope with a coil (2), with a yoke carrying the coil (2), with a sample holder for holding a sample, and with two poles (26, 27) of the yoke adjoining the sample holder. A gap is present in the yoke between each pole and the coil (2). Further, the invention refers to a method of operation of a Magnetization device (1, 11), wherein the Magnetization device (1, 11) comprises a coil (2), a yoke carrying the coil (2), and a sample holder for holding a sample, wherein two poles (26, 27) of the yoke adjoin the sample holder, wherein a gap is present in the yoke between each pole and the coil (2), wherein at least a part of the yoke carrying one or more coils (2) is separated from a part of the Magnetization device (1, 11) comprising the sample holder. A sample is placed on the sample holder by means of an optical microscope and subsequently the part of the Magnetization device (1, 11) comprising the sample holder is connected to the part of the Magnetization device (1, 11) comprising one or more coils (2).