Device and Method for Localization of Inhomogeneities in a Sample

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This invention provides a device and method for non-destructive localization of inhomogeneities (material irregularities or defects) within a sample. It works by introducing a localized electric field into the sample and detecting the resulting mechanical response—especially the electrostrictive effect, which changes in the presence of inhomogeneities. The system is suitable for use in scanning probe microscopes, where a fine tip introduces the field at precise locations. The response can identify very small defects, down to the nanometer scale, potentially enabling real-time (online) monitoring of technical components for hidden damage or weaknesses.

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• Non-destructive testing and quality control in materials science to detect micro- and nano-scale defects.
• Characterization of thin film structures and semiconductor devices for process monitoring and defect localization.
• Real-time online monitoring of critical components (e.g., aerospace, microelectronics, vacuum windows) to predict and prevent mechanical failure.
• Advanced scanning probe microscopy for detailed mapping of electrostrictive and piezoelectric behavior in materials research.
• Correlative imaging in research settings—simultaneous mapping of topographical and sub-surface inhomogeneities.

BenefitsContent extracted from patent full text and abstract with AI.

• High spatial resolution, capable of detecting nanoscale inhomogeneities that are invisible to traditional non-destructive methods such as ultrasound or X-rays.
• Non-destructive: The sample remains intact, allowing further use or repeated measurements.
• Can distinguish between piezoelectric and electrostrictive mechanical responses for more comprehensive material characterization.
• Allows for integration into scanning probe microscopes or as fixed sensors for continuous monitoring in industrial environments.
• Enables early detection of hidden defects, which can prevent catastrophic failure and extend the useful life of critical components.

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Patent Abstract

The invention relates to a device and to a method for locating inhomogeneities in a sample. The measurement principle is based on introducing an electric field into the sample and measuring the mechanical response, particularly the electrostrictive response, of the sample to said field. Inhomogeneities in the sample locally weaken the electric field and thereby lower the symmetry thereof. As a result, the contributions of individual regions of the sample to a mechanical response measured at a given measurement site are changed such that this can be recorded at the measurement site. The measurement principle can be implemented not only in the form of a scanning probe method and scanning probe microscope, but also as part of the online monitoring of technical components at risk of breakage.