Sensor Arrangement

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The invention describes a sensor arrangement for detecting deformation of a surface caused by an applied force. It consists of two strips (at least one movable) laid out in the same plane on the surface to create a tunnel contact. When the surface deforms, the distance between the strips increases, and this change is measured—allowing sensitive detection of minute mechanical deformations. The solution improves upon previous infrared sensor arrangements by offering higher sensitivity and robustness while simplifying the construction and reducing the risk of contact failure.

Use CasesContent extracted from patent full text and abstract with AI.

• Infrared sensors for detecting thermal radiation via membrane deformation (e.g. flame, motion, or presence detectors)
• Mechanical strain sensors for structural health monitoring in civil engineering or aerospace
• Microelectromechanical systems (MEMS) for precision measurement of force, stress, or pressure
• Sensitive detectors for pressure changes in sealed chambers or scientific instrumentation
• Wearable sensors for monitoring physical forces or vital signs via skin deformation
• Miniaturized sensors in IoT devices needing reliable and robust deformation measurement

BenefitsContent extracted from patent full text and abstract with AI.

• Highly sensitive to very small deformations, enabling precise measurements.
• Robust design reduces the risk of sensor failure from contact collision, enhancing reliability.
• Planar arrangement simplifies production and integration, especially with MEMS and microfabrication techniques.
• Works with feedback regulation for even greater measurement control and consistency.
• Material choice (e.g., iridium) ensures mechanical stability, chemical inertness, and longevity.
• Can be used in regulated or unregulated modes for broader application flexibility.
• Suitable for integration into infrared sensors, increasing their sensitivity and responsiveness.

Technical Classifications (CPCs)

Inventors & Applicants

Patent Abstract

The invention relates to a sensor arrangement for measuring the deformation of a surface caused by a force, characterized in that a first strip and a second strip are arranged in the same plane on the surface in order to form a tunnel contact, of which at least the first strip is movably arranged on the surface so that the distance of the two strips from each other is increased when the surface is deformed due to the action of force.