Sample`s i.e. group three nitride, reciprocal grid point measuring method, involves producing reflex at grid point by X-ray diffraction experiment, and performing another X-ray diffraction experiment at point under same angle of incidence

Simple SummaryContent extracted from patent full text and abstract with AI.

This patent describes a method for measuring the properties of a sample—specifically materials like group III nitrides—using X-ray diffraction. The technique involves creating and recording a specific X-ray reflection (reflex) at a particular grid point, then performing a second X-ray diffraction measurement at the same point but with a perpendicular setup, both at the same angle of incidence.

Use CasesContent extracted from patent full text and abstract with AI.

• Analyzing the crystal structure and quality of semiconductor materials such as GaN, AlN, or InN used in electronics and optoelectronics
• Quality control in manufacturing processes of LED or laser diode devices
• Research and development in material science to study thin films and epitaxial layers
• Characterization of stress, defects, or texture in advanced materials

BenefitsContent extracted from patent full text and abstract with AI.

• Improves accuracy and detail of crystal structure analysis by allowing measurements from two perpendicular directions
• Enables better quality control for materials used in high-performance electronics and optoelectronic devices
• Provides a non-destructive testing method, preserving sample integrity
• Facilitates deeper insight into material properties such as strain, defects, or grain orientation

Technical Classifications (CPCs)

Inventors & Applicants

Patent Abstract

The method involves producing a reflex is produced at a reciprocal grid point of a sample i.e. group three nitride, by using an arrangement in a X-ray diffraction experiment and recording the reflex with the help of a detector. Another X-ray diffraction experiment is performed at the same reciprocal grid point with an arrangement of x-ray tube and detector standing perpendicularly to the measurement under the same angle of incidence i.e. zero, and is recorded by using the latter detector. The X-ray tubes used in the measurements are selected to have either round or quadratic cross section.