Method for measurement of impedance of specimen with accurate amplitude and phase, involves impressing alternate current in specimen, where impression with alternate current is carried out at two locations with device for impression

Simple SummaryContent extracted from patent full text and abstract with AI.

This patent describes a method and device for accurately measuring the impedance of a specimen by applying alternating currents at two different locations and analyzing the resulting electromagnetic signals. The process involves repeating the current application with different amplitudes and phases to ensure precise results.

Use CasesContent extracted from patent full text and abstract with AI.

• Quality control in manufacturing materials (metals, polymers, semiconductors)
• Non-destructive testing in construction or electronics
• Medical diagnostics using tissue impedance measurements
• Research in material science for characterizing new materials
• Testing of electrical properties in electronic components

BenefitsContent extracted from patent full text and abstract with AI.

• Provides more accurate amplitude and phase impedance measurements compared to traditional methods
• Enables non-destructive testing, preserving the specimen's integrity
• Allows for improved quality control and material characterization
• Reduces measurement errors by analyzing responses at multiple locations and varying signal characteristics
• Useful in a wide range of fields including engineering, medicine, and materials research

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Patent Abstract

The method involves impressing an alternate current on a specimen (16), where an impression with alternate current is carried out at two locations with a device for the impression. The resulting electromagnetic signal is measured with another unit. Another impression of alternate current with amplitudes and phases that are alternate to the previous measurement is carried out at the same two locations of the specimen and the resulting signal is measured again. An independent claim is included for a device for measurement of the impedance of a specimen.