Method for Examining a Sample

Publication: WO2009062631A2
Published: 2009-05-22
Family Size: 11
Granted: Yes (5/11)

Simple SummaryContent extracted from patent full text and abstract with AI.

This invention describes a novel method for examining samples using a scanning tunneling microscope (STM). By applying a contrast agent (often a light gas such as hydrogen or helium) to the tip and/or the sample surface and cooling the area below the condensation temperature of the agent, the method enables high-resolution imaging that reveals both atomic-scale geometric and chemical structure, surpassing the usual limitations of conventional STM, which only provides electronic density information.

Use CasesContent extracted from patent full text and abstract with AI.

  • Analyzing the atomic structure and chemical identity of surfaces in material science research.
  • Identification and study of molecular and atomic structures in nanotechnology.
  • Chemical characterization and imaging of biological samples at the nanoscale.
  • Improved surface analysis in semiconductor and electronics manufacturing.
  • Investigation of catalytic surfaces and active sites in chemistry.

BenefitsContent extracted from patent full text and abstract with AI.

  • Provides simultaneous atomic-level geometric and chemical contrast, enabling identification of atomic and molecular structures.
  • Enhances the sensitivity and resolution of STM imaging.
  • Allows for the direct chemical identification of nanoscale objects and surface features.
  • Flexible methodology adaptable to different gases and experimental setups.
  • Makes it possible to switch between conventional electronic STM imaging and the new chemical contrast mode for comprehensive analysis.
  • Facilitates the study of systems where chemical specificity is crucial, such as catalysis or molecular electronics.

Technical Classifications (CPCs)

Main Classifications

Physics & Measurement

Sub Classifications

Measuring & Testing

CPC Codes

G01Q30/10G01Q30/12G01Q60/10

Inventors & Applicants

Applicants

Forschungszentrum Juelich Gmbh

Temirov Ruslan

Subach Sergey

Tautz Frank Stefan

Patent Abstract

The invention relates to a method for examining a sample using a scanning tunneling microscope, characterised in that in at least one location on the tip of the scanning tunneling microscope and/or on the sample, which is part of the tunneling contact on taking an image, a contrast agent is applied before or during the image taking, whilst the temperature at said location is adjusted to be at or below the condensation temperature of the contrast agent. A corresponding scanning tunneling microscope is also disclosed.

Key Information

Publication No.

WO2009062631A2

Family ID

40282389

Publication Date

2009-05-22

Application No.

EP2008009391W

Application Date

2008-11-07

Priority Date

2007-11-15

Granted

Yes (5/11)

Possible Cooperation

For further information please contact the transfer office.