Method for Examining a Sample
Simple SummaryContent extracted from patent full text and abstract with AI.
This invention describes a novel method for examining samples using a scanning tunneling microscope (STM). By applying a contrast agent (often a light gas such as hydrogen or helium) to the tip and/or the sample surface and cooling the area below the condensation temperature of the agent, the method enables high-resolution imaging that reveals both atomic-scale geometric and chemical structure, surpassing the usual limitations of conventional STM, which only provides electronic density information.
Use CasesContent extracted from patent full text and abstract with AI.
- Analyzing the atomic structure and chemical identity of surfaces in material science research.
- Identification and study of molecular and atomic structures in nanotechnology.
- Chemical characterization and imaging of biological samples at the nanoscale.
- Improved surface analysis in semiconductor and electronics manufacturing.
- Investigation of catalytic surfaces and active sites in chemistry.
BenefitsContent extracted from patent full text and abstract with AI.
- Provides simultaneous atomic-level geometric and chemical contrast, enabling identification of atomic and molecular structures.
- Enhances the sensitivity and resolution of STM imaging.
- Allows for the direct chemical identification of nanoscale objects and surface features.
- Flexible methodology adaptable to different gases and experimental setups.
- Makes it possible to switch between conventional electronic STM imaging and the new chemical contrast mode for comprehensive analysis.
- Facilitates the study of systems where chemical specificity is crucial, such as catalysis or molecular electronics.
Technical Classifications (CPCs)
Main Classifications
Physics & Measurement
Sub Classifications
Measuring & Testing
CPC Codes
Inventors & Applicants
Applicants
Forschungszentrum Juelich Gmbh
Temirov Ruslan
Subach Sergey
Tautz Frank Stefan
Patent Abstract
The invention relates to a method for examining a sample using a scanning tunneling microscope, characterised in that in at least one location on the tip of the scanning tunneling microscope and/or on the sample, which is part of the tunneling contact on taking an image, a contrast agent is applied before or during the image taking, whilst the temperature at said location is adjusted to be at or below the condensation temperature of the contrast agent. A corresponding scanning tunneling microscope is also disclosed.
Key Information
Publication No.
WO2009062631A2
Family ID
40282389
Publication Date
2009-05-22
Application No.
EP2008009391W
Application Date
2008-11-07
Priority Date
2007-11-15
Granted
Yes (5/11)
Possible Cooperation
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