Method and Apparatus for Determining an Electron Beam Diameter

Publication: DE102010025123A1
Published: 2011-12-29
Family Size: 2
Granted: No

Simple SummaryContent extracted from patent full text and abstract with AI.

This patent describes a method and device for measuring the diameter of an electron beam using a set of parallel wire sensors. The electron beam is systematically swept over these stationary, electrically insulated wires (made of high-melting point metals like tungsten, tantalum, or molybdenum), which are mounted at precise distances above a cooled base plate. As the beam passes over the wires, measurement signals related to changes in voltage are generated, collected, and analyzed to determine the beam's exact diameter quickly and reliably. This method allows a simple, non-destructive way to characterize the geometry and focus quality of powerful electron beams used in various industrial and research applications.

Use CasesContent extracted from patent full text and abstract with AI.

  • Quality control in electron beam welding and additive manufacturing to ensure proper beam focus and weld integrity.
  • Research and maintenance of fusion devices, such as ITER, where precise knowledge of electron beam characteristics is important for testing plasma-facing materials.
  • Calibration and diagnostics in laboratories operating electron beam facilities for materials testing or surface treatment.
  • Monitoring and optimizing electron beam processes to prevent damage or melting due to excessive local power densities.
  • Use in vacuum systems or potentially under controlled gas atmospheres to measure electron beams in different settings.

BenefitsContent extracted from patent full text and abstract with AI.

  • Provides a fast, accurate, and simple means of measuring electron beam diameter without complex, moving parts.
  • Enables real-time or routine diagnostics of electron beam quality, improving safety and process reliability.
  • Enhances process control for electron beam applications, leading to better product quality in manufacturing.
  • Can be used with high-power electron beams (up to 200 kW) and withstands high temperatures due to use of robust materials.
  • Flexible for use in both vacuum and atmospheric environments (with modifications), making it versatile for various industries.
  • Reduces downtime by simplifying the measurement process, allowing quick interventions if beam parameters deviate.

Technical Classifications (CPCs)

Main Classifications

Electrical & Electronic Tech

Physics & Measurement

Sub Classifications

Electric Elements

Electric Techniques (Other)

Measuring & Testing

CPC Codes

G01T1/29H01J47/16H05H1/0081

Inventors & Applicants

Applicants

Forschungszentrum Juelich Gmbh

Patent Abstract

The arrangement has two wires formed as wire sensors and firmly arranged parallel to each other. The wires are electrically insulated against a coolable base plate, and comprise a forwarding unit that forwards a measurement signal to an evaluation unit. The wires are made from tungsten, tantalum and molybdenum. Diameter of each wire is in a range between 0.1 and 0.5 mm. The wires are firmly connected with the base plate over two respective ceramic bushings (5, 6) exhibiting respective spacers. The wires are arranged at equal distance to the plate with respect to midpoints of the wires. An independent claim is also included for a method for measuring of diameter of an electron beam.

Key Information

Publication No.

DE102010025123A1

Family ID

45115583

Publication Date

2011-12-29

Application No.

DE102010025123A

Application Date

2010-06-25

Priority Date

2010-06-25

Granted

No

Possible Cooperation

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