Method for Minimally Invasive Measurement of Radiation Intensity

Publication: DE102013004616A1
Published: 2014-09-18
Family Size: 3
Granted: Yes (1/3)

Simple SummaryContent extracted from patent full text and abstract with AI.

This invention is a minimally invasive method for measuring the intensity of a radiation beam (such as a neutron or particle beam) by using a target material placed in the beam's path to emit secondary radiation (like gamma rays). A detector placed outside the primary beam path measures this secondary radiation, allowing accurate monitoring of beam intensity without significantly disturbing or absorbing the primary beam.

Use CasesContent extracted from patent full text and abstract with AI.

  • Continuous intensity monitoring of neutron beams in research reactors or particle accelerators.
  • Real-time beam monitoring in medical radiation therapy systems to ensure precise dosing.
  • Beam quality control in industrial inspection systems that use X-ray, neutron, or particle beams.
  • Integration in compact or crowded experimental setups where traditional beam monitors are impractical.
  • Retrofit into existing facilities by utilizing already-present materials as the target, minimizing hardware changes.

BenefitsContent extracted from patent full text and abstract with AI.

  • Minimizes disruption and energy loss in the primary beam, preserving its quality for experiments or applications.
  • Allows flexible detector placement, even outside cramped beam lines or experimental setups.
  • Measurement sensitivity can be easily adjusted without altering the primary beam path.
  • Reduces space requirements compared to traditional in-beam detectors, making it suitable for tight installations.
  • Can correct for background or stray radiation, enhancing measurement accuracy.
  • Potential for non-invasive retrofitting into existing beamline infrastructure.

Technical Classifications (CPCs)

Main Classifications

Physics & Measurement

Sub Classifications

Measuring & Testing

CPC Codes

G01T1/29G01T3/00

Inventors & Applicants

Applicants

Forschungszentrum Juelich Gmbh

Patent Abstract

The invention relates to a method for measuring the intensity of a beam with little influencing thereof. In this case, a target material situated in the beam path of the primary beam is exerted by the primary beam to emit secondary radiation. The intensity of said secondary radiation is measured by a detector arranged outside the beam path of the primary beam. It has been recognized that, as a result of the spatial separation of target material and detector, firstly a high accuracy and efficiency of the measurement and secondly little influencing of the primary beam are no longer conflicting aims. Any material that is additionally introduced into the beam path of the primary beam influences the primary beam and possibly impairs the usability thereof for the actual application. By virtue of the fact that the detector now no longer need to be arranged in said beam path, the influencing of the primary beam is advantageously minimized. The freedom in the positioning of the detector is all the greater, the less directionally the secondary radiation is emitted. As a result of the arrangement of the detector outside the beam path of the primary beam, it is advantageously also possible to adapt the sensitivity of the measurement, that is to say the measurement range, without intervention in the beam path of the primary beam. For this purpose, it is merely necessary to make the detector less sensitive to the secondary radiation.

Key Information

Publication No.

DE102013004616A1

Family ID

50396822

Publication Date

2014-09-18

Application No.

DE102013004616A

Application Date

2013-03-15

Priority Date

2013-03-15

Granted

Yes (1/3)

Possible Cooperation

For further information please contact the transfer office.