Method for analysis of element concentrations in e.g. brain tissue part and for topographic characterization of sample, involves detecting topography of sample surface before and/or after laser ablation using cone as part of microscope

Simple SummaryContent extracted from patent full text and abstract with AI.

This invention describes a method and device for analyzing the concentrations of elements within samples such as brain tissue and characterizing their surface topography. The technique uses a highly focused laser beam and a metallic cone, which acts as part of an atomic force microscope, to both ablate the sample and provide detailed imaging before and after the ablation. The setup allows for precise, high-resolution element analysis and mapping at a very small scale.

Use CasesContent extracted from patent full text and abstract with AI.

• Mapping and analyzing elemental distribution in biological tissues like brain samples for medical research
• Material science investigations for understanding elemental composition at micro or nanoscales
• Quality control and characterization in semiconductor manufacturing
• Forensic analysis of tiny sample residues
• Archaeological or art restoration studies for non-destructive elemental profiling

BenefitsContent extracted from patent full text and abstract with AI.

• Achieves very high spatial resolution (less than 1 micrometer) in both analysis and imaging
• Permits simultaneous elemental and topographic characterization, enhancing data accuracy
• Allows non-destructive or minimally invasive analysis suitable for delicate samples like biological tissues
• Can be adapted for use in multiple scientific and industrial fields
• Utilizes standard components (laser, microscopic metallic cone) in an innovative combination for improved performance

Technical Classifications (CPCs)

Inventors & Applicants

Patent Abstract

The method involves intensifying a laser beam in proximity of a surface of a sample at a metallic cone (2) in a near field, where the surface of the sample is irradiated by a neodymium-doped yttrium aluminium garnet laser. The cone is positioned in proximity of spot of the laser beam, where the laser beam is focussed on the surface of the sample. Topography of the sample surface is detected before and/or after laser ablation using the cone as a part of an atomic force microscope, where the laser beam on diameter of the spot is less than 1 micrometer, and the cone is made of silver or gold. An independent claim is also included for a device for analysis of element concentrations and for topographic characterization of a sample.