A Device for Transforming Between an Azimuthal Phase and a Linear Phase in a Charged Particle Beam

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This patent describes a device that transforms the phase structure of a charged particle beam, such as an electron beam, between azimuthal (orbital angular momentum) and linear phases. The core invention is a compact, planar arrangement of needle-shaped electrostatic electrodes that enables precise phase manipulation—specifically, converting between twisted (vortex) and flat wavefronts. This device improves practical implementation within constrained spaces like electron microscopes and can be enhanced with additional features such as diffraction gratings for higher resolution.

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• Electron microscopy—measuring and sorting electron beams based on their orbital angular momentum (OAM).
• Quantum physics experiments—manipulating and detecting the OAM of charged particles for research in quantum information and fundamental physics.
• Material science—analyzing magnetic properties and chirality in materials by investigating how electron vortex beams interact with matter.
• Particle beam shaping—engineering specific phase profiles in beams for advanced imaging techniques or microfabrication.
• Integration into analytical devices in laboratories, enabling compact, MEMS-compatible phase control in electron and ion beam systems.

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• Compact and planar electrode design allows integration into small spaces, such as inside electron microscopes.
• MEMS-compatible fabrication, leading to cost-effective and scalable production.
• Eliminates the need for bulky electrostatic mirrors, simplifying device architecture.
• High precision in phase manipulation and correction, improving measurement speed and accuracy.
• Enhanced resolution possible with additional features like diffraction gratings, leading to better separation and identification of discrete orbital angular momentum states.
• Versatile—can be applied to any type of charged particle beams, not just electrons.

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Patent Abstract

A device for transforming between an azimuthal phase and a linear phase in a charged particle beam A device for transforming between an azimuthal phase and a linear phase in a charged particle beam (10), the device comprising a first phase changing element (S1) and a second phase changing element (S2) arranged along a beam axis (20) at conjugate Fourier planes of a lens system (L1). The first phase changing element (S1) comprises a planar electrostatic arrangement of needle-shaped electrodes arranged orthogonally to the beam axis (20), the electrostatic arrangement comprising a first needle-shaped electrode (41) and a pair of second needle-shaped electrodes (42) arranged on opposite sides of, and oriented orthogonally to, the first needle-shaped electrode (41). The electrostatic arrangement further comprises a third needle-shaped electrode (43) and a pair of fourth needle-shaped electrodes (44) arranged mirror-wise with respect to the first needle-shaped electrode (41) and second needle- shaped electrodes (42), about a symmetry plane (M) arranged orthogonally to the first needle-shaped electrode (41).