Method for Depositing Individual Atoms and/or Molecules on a Sample Surface and Device for Carrying Out the Method

Simple SummaryContent extracted from patent full text and abstract with AI.

This invention relates to a method and device for depositing single atoms and/or molecules onto a sample surface. It uses a micro-evaporator, which contains a filament that is electrically heated to vaporize the deposition material. This allows for precise control over the placement of individual atoms or molecules onto the surface for scientific measurement or fabrication purposes.

Use CasesContent extracted from patent full text and abstract with AI.

• Fabrication of nanoscale devices by placing atoms or molecules with high precision
• Calibration and testing in scanning probe microscopy and related instruments
• Research in material science, especially in constructing atomic-scale structures
• Manufacturing components for quantum computing or nanoelectronics
• Developing standards or references for surface science measurements

BenefitsContent extracted from patent full text and abstract with AI.

• Allows for extremely precise deposition of individual atoms or molecules
• Enables advanced research at the atomic scale
• Improves calibration and accuracy for measurement devices
• Supports the development of new nanotechnologies and quantum devices
• Can be integrated into existing scientific instrumentation easily

Technical Classifications (CPCs)

Inventors & Applicants

Patent Abstract

The present invention relates to a method for depositing individual atoms and/or molecules on a sample surface, in which at least one micro-evaporator (9) is provided in a housing (5) of a measuring apparatus, wherein the or the respective micro-evaporator (9) comprises or is formed by a filament (14) of a micro-incandescent lamp (10) and contact elements (15a) for voltage supply, wherein electrical connection means (8) for the voltage supply of the or the respective micro-evaporator (9), evaporator connection means (8), are held at the housing (5) of the measuring apparatus (2), and at least one contact element (15a) of the or the respective micro-evaporator (9) is brought into contact with the evaporator connection means (8), and the filament (14) of the or the respective micro-evaporator (9) is electrically supplied in such a manner using the evaporator connection means (8) that a deposition material applied to the filament (14) and/or the filament (14) itself is evaporated.