Method and Device for Determining the Electrical Resistance of an Object

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This invention describes a method and a device for accurately determining the electrical resistance of an object using at least four measurement contacts. Two contacts are used to inject current, and two separate contacts are used for voltage measurement. Critically, the system adjusts the voltage at the voltage-measurement contacts so that no current flows through them, which eliminates errors from contact resistance. This configuration enables precise resistance measurements, including non-invasive measurements at the micro and nanoscale.

Use CasesContent extracted from patent full text and abstract with AI.

• Characterizing materials such as metals, semiconductors, and thin films in scientific research.
• Measuring resistance of electronic components and printed circuit boards in manufacturing quality control.
• Non-destructive testing of soils and geological samples in environmental and civil engineering.
• Studying nanoscale and microscale structures in nanotechnology and semiconductor industries.
• Measuring resistance of organic or composite materials.
• Implementing in multi-probe scanning probe microscopes for surface analysis.

BenefitsContent extracted from patent full text and abstract with AI.

• Provides highly accurate resistance measurements by eliminating errors from contact and lead resistance.
• Enables non-invasive resistance measurement, preserving delicate surfaces or nanostructures.
• Suitable for a wide range of objects and materials from macroscopic samples to nanostructures.
• Simplifies experimental setup by allowing easy reconfiguration of probe function via software, without rewiring.
• Reduces electrical noise and systematic measurement errors, improving data quality.
• Allows parallel and rapid measurements by supporting multiple contacts.
• Facilitates advanced research in materials science, electronics, and nanotechnology.

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Patent Abstract

The invention relates to a method and a device for determining the electrical resistance of an object. According to the invention, the method is for measuring the electrical resistance of an object, in which at least four measurement contacts are brought into electrically conductive contact with the surface of the object, wherein, from these at least four electrically conductive measurement contacts, at least two measurement contacts are measurement contacts to which a current (2, 2a) is to be applied and at least two measurement contacts are measurement contacts for the voltage measurement (3, 3a), wherein at least one measurement contact to which a current (2, 2a) is to be applied is used to inject a current into the object and a current is tapped off from at least one measurement contact to which a current is to be applied, and a voltage is in each case measured at the object with the at least two measurement contacts for the voltage measurement (3, 3a), wherein measurement electronics are connected to each measurement contact for the voltage measurement, which electronics measure the current flowing through the contact between the measurement contact for the voltage measurement (3, 3a) and the object, wherein the current between the measurement contact for the voltage measurement (3, 3a) and the object is controlled by applying a bias voltage such that it no longer flows, and the bias voltage is therefore equal to the voltage of the object at the point of the measurement contact for the voltage measurement. The resistance of the object is calculated from the measured values for current and voltage according to Ohm's law.