Scattering-type Scanning Near-Field Optical Microscope (ssnom) System

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This invention relates to a novel scattering-type scanning near-field optical microscope (sSNOM) system that enables rapid, high-resolution, nanoscale imaging of materials and biological samples. The system utilizes a unique sample holder and fast scanning mechanisms in both horizontal (x, y) and vertical (z) directions, allowing for time-resolved (dynamic) imaging of extremely small features and fast processes. Key features include real-time frame scanning, phase/amplitude measurement for each pixel, and the capability to image biological molecules in their natural (including aqueous) environments with minimal noise.

Use CasesContent extracted from patent full text and abstract with AI.

• Real-time observation of structural changes in biological molecules such as proteins and polymers at the nanoscale.
• High-speed, high-resolution imaging of dynamic processes in living cells or biomembranes.
• Correlative imaging combining AFM and optical contrast in material sciences, nanotechnology, and semiconductor industries.
• Study of chemical composition and distribution in complex nanostructures or heterogeneous samples.
• Quality control and defect analysis in nanofabricated devices or materials.
• Dynamic monitoring of interactions (e.g., protein-ligand binding) in pharmaceutical research.

BenefitsContent extracted from patent full text and abstract with AI.

• Enables fast, time-resolved (4D) imaging to observe real-time dynamic changes in biological or material samples.
• Achieves high spatial resolution beyond the diffraction limit (down to nanometer scale).
• Combines optical and topographical data for comprehensive sample characterization.
• Can function in liquid environments, allowing imaging of biological samples in their native state.
• Reduces measurement noise through the use of a photoelastic modulator or improved interferometry.
• Allows for high throughput due to increased scan speeds (potentially up to 6 kHz per scanned line).
• Compact and robust design facilitates integration into laboratory workflows.

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Patent Abstract

Scattering-type scanning near-field optical microscope (sSNOM) which comprises: a sample holder configured to hold a sample. The sample holder and the scanning probe tip are adjustable relative to each other in the x-, y-directions by means of a horizontal scanning device, wherein the horizontal scanning device is configured to move the sample located on the top side of the sample holder in the x- and y-directions relative to the scanning probe tip, wherein a plurality of frames is scanned subsequently, each frame representing the scan area of the sample at a specific time interval, and each frame comprising pixels arranged in lines and columns in the x- and y-directions, wherein for each pixel a measurement of phase and/or amplitude is made, and wherein the horizontal scanning device is configured to move the sample along the lines of each frame with a predetermined frequency.