Nondestructive Analytical Method for Determining the Quality of a Thin-Film Solar Cell Using Photoluminescence Spectroscopy

Simple SummaryContent extracted from patent full text and abstract with AI.

This patent discloses a nondestructive method for assessing the quality of thin-film solar cells, specifically those based on chalcopyrite materials, using photoluminescence spectroscopy. The technique involves measuring the photoluminescence spectrum at room temperature, identifying the main emission peak near the material's band gap, and correlating its position with the open-circuit voltage of the solar cell. This allows for quick, in-line determination of a solar cell's quality early in the manufacturing process, without damaging the device.

Use CasesContent extracted from patent full text and abstract with AI.

• In-line quality control during the manufacturing of thin-film chalcopyrite-based solar cells.
• Early detection of manufacturing defects in solar cell absorber layers.
• Screening and optimization of process parameters in solar module production lines.
• Homogeneity mapping of large solar modules to identify quality variations across the surface.
• Development, research, and optimization of new absorber materials for solar cells.

BenefitsContent extracted from patent full text and abstract with AI.

• Nondestructive testing preserves valuable solar cell material and products.
• Enables rapid, real-time quality assessment during the manufacturing process (within seconds).
• Improves overall manufacturing yield by allowing the removal of substandard units early.
• Correlates directly with important electrical properties such as open-circuit voltage, offering predictive power.
• Applicable even for materials with weak photoluminescence yield, increasing versatility.
• Reduces costs by minimizing waste and allowing targeted interventions.
• Enhances process control and allows optimization based on immediate feedback.

Technical Classifications (CPCs)

Inventors & Applicants

Patent Abstract

Disclosed is an analytical method for determining the quality of a chalcopyrite-based solar cell using photoluminescence measurements. Said method, which is to allow the absorber material to be analyzed quickly, i.e. within seconds, taking photoluminescence measurements at room temperature, includes the following steps: the sample is first measured in a spectrally resolved manner at least following the production of the absorber layer at room temperature; the first peak that is located near the band gap and dominates the measured photoluminescence spectrum is then analyzed in terms of the spectral position thereof; said first peak is compared with measurements of the open-circuit voltage taken beforehand on material samples having the same type of absorber layer, in accordance with the position of the peak that is located near the band gap and is determined using photoluminescence; and said first peak is evaluated in accordance with known threshold values or optimum values of the open-circuit voltage.