Device for Measuring Resonant Inelastic X-ray Scattering of a Sample

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This invention discloses a device for measuring resonant inelastic x-ray scattering (RIXS) in a sample using two crossed reflection zone plates (special diffractive optical elements). The system aligns these plates such that each disperses x-rays in perpendicular directions, allowing the analysis of inelastically scattered x-rays from the sample in a single exposure step. A two-dimensional detector records the resulting energy and momentum information of the scattered radiation, enabling high-resolution measurement over a broad x-ray energy range with fewer optical elements.

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• Materials science research to characterize electronic states and lattice vibrations in solids.
• Element-specific probing in chemistry, physics, and nanotechnology laboratories using synchrotron or laboratory x-ray sources.
• Fast and high-resolution analysis of the electronic and magnetic properties of advanced materials (such as superconductors, catalysts, or battery materials).
• Correlated electron system investigations in fundamental physics research.
• Time-resolved studies of electronic transitions under changing conditions (e.g. temperature, magnetic field).

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• Allows simultaneous (non-sequential) collection of energy-resolved scattering data with a single illumination step, greatly reducing measurement time.
• Utilizes a minimal number of optical elements (only two zone plates needed), reducing system complexity and potential for x-ray intensity losses.
• Provides high reflectivity and efficiency, leading to stronger signal and improved energy resolution (up to 40,000).
• Covers a wide x-ray energy range from soft to hard x-rays, enabling application across diverse materials and experiments.
• Compact and flexible design allows adaptation and automation for different wavelength ranges or experimental conditions.

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Patent Abstract

The invention relates to a device for measuring resonant inelastic x-ray scattering of a sample. The device has at least two reflection zone plates (1.RZP, 2.RZP) which are arranged to allow cross-dispersion, a sample to be examined (P) being located in the beam path behind the first reflection zone plate (1.RZP). A second reflection zone plate (2.RZP) disperses the radiation scattered by the sample perpendicular to the dispersion direction of the first reflection zone plate (1.RZP). In the focus of the exiting diffracted radiation of the second reflection zone plate (2.RZP) is arranged a means for two-dimensional detection (D) of the scattered radiation.