Electrostatic Analyzer for Charged Particles, Spectrometer and Monochromator with Such an Analyzer

Publication: DE102008058144A1
Published: 2010-05-27
Family Size: 4
Granted: Yes (1/4)

Simple SummaryContent extracted from patent full text and abstract with AI.

This invention describes an improved electrostatic energy analyzer for charged particles, such as electrons or ions, used in spectrometers and monochromators. It introduces a special correction of the electric field using boundary elements that create a potential profile similar to a rectangular bathtub. This configuration optimizes how charged particles are focused and transmitted through the analyzer, resulting in higher particle count rates (sensitivity) and better energy resolution, all while keeping the analyzer's design simple and compact.

Use CasesContent extracted from patent full text and abstract with AI.

  • Material analysis using electron spectroscopy (e.g., XPS, UPS, AES, EELS) for research or industrial quality control.
  • Energy filtering of charged particles in particle accelerators or detectors.
  • Angle-resolved studies of surfaces and thin films using photoelectron emission.
  • Spectrometers and monochromators for laboratories or industrial processes requiring precise energy analysis of electrons or ions.
  • Upgrade or retrofitting of existing spectrometers with improved sensitivity and resolution.

BenefitsContent extracted from patent full text and abstract with AI.

  • Improved energy resolution, enabling more precise identification of material properties.
  • Higher sensitivity (better count rates), allowing the detection of weaker particle signals.
  • Simplicity and robustness—can be implemented without adding complex voltage supplies or dramatically changing existing spectrometer designs.
  • Flexible implementation in different analyzer geometries (parallel plate, cylindrical, conical, etc.).
  • Enables compact spectrometer designs comparable in performance to more complex systems (e.g., hemispherical analyzers).
  • Suitable for angle-resolved measurements and wide detector acceptance angles.

Technical Classifications (CPCs)

Main Classifications

Electrical & Electronic Tech

Sub Classifications

Electric Elements

CPC Codes

H01J49/48

Inventors & Applicants

Applicants

Helmholtz Zent B Mat & Energ

Patent Abstract

The invention relates to an electrostatic primary energy analyzer for charged particles, having at least one main and one return electrode for generating an electrostatic field during the passage of the charged particle through the analyzer, and means for correcting the electrostatic field. Such an analyzer should be of simple construction and ensure an improved count rate (sensitivity) and energy resolution for a given parameter of an angle-selective spectrometer/monochromator for charged particles. Said object is achieved in that the means for correcting the electrostatic field form long-range boundary fields in the polar and/or azimuth direction with regard to the energy-dispersive direction of the charged particle, wherein the equipotential surfaces of the long-range boundary fields form a shape similar to the basin of a rectangular bathtub.

Key Information

Publication No.

DE102008058144A1

Family ID

42110521

Publication Date

2010-05-27

Application No.

DE102008058144A

Application Date

2008-11-20

Priority Date

2008-11-20

Granted

Yes (1/4)

Possible Cooperation

For further information please contact the transfer office.