IR Spectrometric Method and Associated Reflection Element and Component
Simple SummaryContent extracted from patent full text and abstract with AI.
This patent describes an improved infrared (IR) spectrometric measurement technique and a specialized reflection element (sensor). The method embeds a specially structured, partially IR-transparent plate into a viscous (semi-liquid) sample or component so that one polished face is exposed for IR light to enter while the other face is structured to scatter or reflect light in multiple ways. This in-situ arrangement allows repeated, highly comparable IR spectra measurements over time, as the reflection element remains fixed in the sample/component, improving measurement precision and reliability, especially as the material transitions from liquid to solid (e.g., during curing processes).
Use CasesContent extracted from patent full text and abstract with AI.
- Real-time monitoring of polymerization or curing processes in composites, resins, and adhesives during manufacturing.
- Quality control of polymer or composite parts in industries such as automotive or aerospace by monitoring changes over time.
- Embedded long-term monitoring of aging, chemical, thermal, or environmental degradation of structural materials.
- In-situ chemical analysis of viscous or solidifying samples in research or industrial process laboratories.
- Calibration and validation of IR spectrometry setups by providing a stable, reproducible measurement location.
BenefitsContent extracted from patent full text and abstract with AI.
- Improved measurement reproducibility and precision by minimizing user-dependent variables (pressure/contact variations).
- Enables serial and long-term in-situ analysis of material changes without repositioning sensors for each measurement, increasing temporal resolution and data comparability.
- Reduces risk of contamination, sensor wear, or measurement errors caused by repeated contact, thanks to permanent embedding.
- Allows monitoring from initial liquid state through solidification, covering entire process cycles without interruption.
- Works with a variety of IR-transparent sensor materials and surface structures, making it adaptable to different chemical and physical environments.
Technical Classifications (CPCs)
Main Classifications
Physics & Measurement
Sub Classifications
Measuring & Testing
CPC Codes
Inventors & Applicants
Inventors
Applicants
Bundesanstalt Fuer Mat und Pruefung Bam
Helmholtz Zentrum Berlin Fuer Mat und Energie Gesellschaft mit Beschraenkter Haftung
Patent Abstract
Described are an IR spectrometric method, an associated reflection element and a component. The IR spectrometric method comprises at least the steps of: a) providing an IR light source, a means for spectral analysis and a reflection element (2) which has at least a first surface (6), which is level, and a second surface (3), which is structured and parallel to the first surface, the structure causing a diverse reflection of an incident IR light beam (4) and the reflection element (2) being manufactured from a material that is at least partially permeable to IR light (4, 5); b) arranging the reflection element (2) in a viscous sample (1), which is to be measured, at time t0 to remain there, the first surface (6) of the reflection element (2) being exposed; c) irradiating the reflection element (2) on the first surface (6) with an IR light beam (4) at any time tx from time t0 at an angle of incidence (γ) that is smaller than the angle of total reflection; and d) recording, by the means for spectral analysis, the spectrum of the IR light (5) which is reflected at a boundary between the second surface (3) of the reflection element (2) and the sample (1). The structure of the second surface (3) of the reflection element (2) causes a diverse reflection of an incident IR light beam by means of a plurality of scatter centres. Also indicated is a component in which such a reflection element for carrying out the method is introduced. The method improves the comparability of spectra because the influence of the measurement setup and the sample location is minimised.
Key Information
Publication No.
DE102020106104A1
Family ID
76180833
Publication Date
2021-09-09
Application No.
DE102020106104A
Application Date
2020-03-06
Priority Date
2020-03-06
Granted
No
Possible Cooperation
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