Optical Arrangement and Method for Generating a Measurement Signal

Simple SummaryContent extracted from patent full text and abstract with AI.

This patent describes an optical arrangement and method for generating a measurement signal by utilizing quantum optics principles. A coherent optical source emits photons that pass through a nonlinear optical device to produce pairs of entangled photons with different wavelengths. One photon interacts with a vibrating sensor element, and its properties are modulated based on the sample's surface it probes. The other photon, which does not interact directly with the sample, is modulated with a separate frequency and, after nonlinear interference, is detected to provide information about the sample's characteristics. This setup enables measurement of properties in one optical domain (e.g., mid-infrared) by detecting photons in another (e.g., near-infrared), suppressing background noise for high-quality signals.

Use CasesContent extracted from patent full text and abstract with AI.

• Non-destructive analysis of surface properties in materials science
• High-resolution microscopy, particularly for samples sensitive to certain wavelengths (e.g., mid-IR)
• Chemical and biological sample analysis where direct detection in the mid-infrared is difficult or impractical
• Surface quality inspections in semiconductor manufacturing
• Medical diagnostics involving tissue spectroscopy
• Remote or indirect material characterization techniques

BenefitsContent extracted from patent full text and abstract with AI.

• Allows retrieval of measurement information from hard-to-detect wavelength ranges (e.g., mid-IR) by using more accessible wavelengths (e.g., near-IR) for detection
• Suppresses background noise and interference, leading to higher quality and sensitivity in measurements
• Non-destructive and contactless analysis, preserving sample integrity
• Potential to analyze samples that are opaque or highly absorbing in the measurement wavelength but transparent in the detection range
• Versatile detection system applicable to a wide range of scientific and industrial fields
• Enhances measurement speed and reliability through innovative modulation and detection schemes

Technical Classifications (CPCs)

Inventors & Applicants

Patent Abstract

The invention relates, inter alia, to an optical arrangement for generating a measurement signal (M) comprising a coherent optical radiation source (10), an optically nonlinear device (30), a beam splitter (40), two radiation paths (SP1, SP2) and a measuring device (200), which can detect a photon (P2'') modulated with a first and a second oscillation frequency (f1, f2) and can evaluate same to form the measurement signal (M).