Device and Method for Determining Spatial Position for an Infrared Measurement System

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This invention provides a device and method for accurately determining the spatial position of measurement points in infrared (IR) measurement systems. It uses a fixed IR emitter as a reference point and an IR sensor (such as a thermal imaging camera) to precisely map temperature data from the surface of objects, such as weld seams, allowing for exact spatial correlation between the measured IR data and their physical locations on the object.

Use CasesContent extracted from patent full text and abstract with AI.

• Quality control of weld seams by thermal imaging in industrial manufacturing
• Non-destructive testing for defects in metalworking and fabrication processes
• Continuous monitoring of temperature distributions on surfaces during production
• Mapping temperature variations for material science research
• Localization of defects or anomalies in additively manufactured components
• Integration with automated inspection systems for real-time quality assurance

BenefitsContent extracted from patent full text and abstract with AI.

• Allows precise spatial localization of IR measurement data, improving defect detection accuracy
• Enables real-time, continuous, and non-destructive quality inspection, reducing the need for costly and time-consuming destructive testing
• Simple and robust implementation using widely available IR emitters and sensors
• Can be adapted to various IR measurement applications and system configurations
• Facilitates immediate corrective actions during manufacturing, potentially increasing product yield and reducing rework
• Scalable for different types of objects, materials, and measurement environments

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Patent Abstract

The present invention relates to a device and a method for determining spatial position for an infrared measurement system. The device comprises a stationary IR emitter (1) as a reference point and an IR sensor (2). The IR emitter (1) is used as a stationary reference point for the determination of the position of the measurement points of the IR sensor (2) on an examined object, the measurement point being sensed by means of the IR sensor (2) and the current position of the measurement point being ascertained by means of the IR emitter (1) as a stationary reference point with respect to the IR sensor (2).