Device for element analysis in imaging systems

Simple SummaryContent extracted from patent full text and abstract with AI.

This invention is a device and method for analyzing the elemental composition of small areas within a sample using X-ray fluorescence in combination with optical magnifying devices (such as a light microscope). It enables precise selection of a spot within the sample under magnification, and then determines its chemical composition by exciting that spot with X-rays generated via pyroelectric, piezoelectric, or ferroelectric effects.

Use CasesContent extracted from patent full text and abstract with AI.

• Precise chemical analysis of microscopic areas in materials science laboratories
• Quality control and failure analysis in manufacturing processes requiring micro-level compositional assessment
• Forensic science for trace evidence analysis
• Biological sample analysis to detect and measure element concentrations in cells or tissues
• Research in geology for mineral composition characterization at a micro-scale

BenefitsContent extracted from patent full text and abstract with AI.

• Enables highly localized elemental analysis with visual targeting under a microscope
• Combines imaging and chemical analysis into a single integrated workflow
• Does not require large X-ray sources, potentially reducing equipment size and complexity
• Allows both qualitative (identifying present elements) and quantitative (measuring concentrations) analysis
• Improves accuracy and efficiency in materials characterization at tiny scales

Technical Classifications (CPCs)

Inventors & Applicants

Patent Abstract

The present invention relates to a device and a method for qualitative and quantitative elemental analysis, in particular of small material areas of a sample (11) by means of X-ray fluorescence on light-optically magnifying imaging devices, such as for example a light microscope, wherein by means of the light-optically magnifying imaging device a sample location in the sample (11) is selectable, and from this sample location the chemical composition is determinable by means of X-ray fluorescence, wherein for excitation of the sample location primary X-radiation Rö1 is generatable with the aid of a pyroelectric, piezoelectric and/or ferroelectric effect.