Tilted-grating approach for scanning-mode X-ray grating interferometry

Publication: EP2942619A1
Published: 2015-11-11
Family Size: 6
Granted: Yes (2/6)

Simple SummaryContent extracted from patent full text and abstract with AI.

This invention introduces a method and system for X-ray grating interferometry that allows fast and efficient imaging of large samples by using a tilted grating and a scanning approach. Instead of requiring expensive large-area gratings and slow phase-stepping procedures, the invention tilts one of the gratings to generate Moiré fringes perpendicular to the grating lines. This enables line detectors to capture multiple phase steps as the sample is scanned, facilitating rapid and accurate retrieval of absorption, differential phase contrast (DPC), and dark-field signals.

Use CasesContent extracted from patent full text and abstract with AI.

  • Medical imaging—such as mammography, bone assessments, or soft tissue imaging—with improved contrast and efficiency.
  • Baggage and cargo screening for homeland security using detailed X-ray images over wide areas.
  • Industrial non-destructive testing and materials inspection of large or long objects (e.g., pipeline segments, manufactured components).
  • Scientific research requiring phase-contrast X-ray imaging for large samples or high-throughput applications.
  • Adaptation to tomosynthesis and computed tomography (CT) for 3D imaging with enhanced phase and structural sensitivity.

BenefitsContent extracted from patent full text and abstract with AI.

  • Eliminates the need for large, expensive X-ray gratings, making high-quality phase-contrast imaging more affordable and scalable.
  • Significantly faster imaging due to elimination of slow conventional phase-stepping, enabling high-throughput scanning.
  • Mechanically robust and compatible with conventional X-ray tubes, supporting easy adoption and maintenance.
  • Enables simultaneous acquisition of absorption, phase-contrast, and dark-field signals, providing richer diagnostic information.
  • Reduces system complexity and alignment challenges compared to alternative multi-step or staggered-grating approaches.

Technical Classifications (CPCs)

Main Classifications

Health, Food & Consumer Tech

Physics & Measurement

Sub Classifications

Measuring & Testing

Medical & Vet Science

Nuclear Physics & Engineering

CPC Codes

A61B6/4035A61B6/4291A61B6/484G01N23/044G21K1/025

Inventors & Applicants

Applicants

Scherrer Inst Paul

Patent Abstract

Among the existent X-ray phase-contrast modalities, grating interferometry appears as a very promising technique for commercial applications, since it is compatible with conventional X-ray tubes and is robust from a mechanical point of view. However, since applications such as medical imaging and homeland security demand covering a considerable field of view, the fabrication of large-area gratings, which is known to be challenging and expensive, would be needed. A scanning setup is a good solution for this issue, because it uses cheaper line instead of large-area 2D detectors and, therefore, would require smaller gratings. In such a setup, the phase-retrieval using the conventional phase-stepping approach would be very slow, so having a faster method to record the signals becomes fundamental. To tackle this problem, the present invention proposes a scanning-mode grating interferometer design, in which a grating is tilted to form Moiré fringes perpendicular to the grating lines. The sample is then translated along the fringes, so each line detector records a different phase step for each slice of the sample.

Key Information

Publication No.

EP2942619A1

Family ID

50693489

Publication Date

2015-11-11

Application No.

EP14167372A

Application Date

2014-05-07

Priority Date

2014-05-07

Granted

Yes (2/6)

Possible Cooperation

For further information please contact the transfer office.