Transverse profile imager for ionizing radiation

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This patent describes an advanced optical system for imaging the transverse profile of ionizing radiation beams (such as X-rays or electron beams) by capturing the visible light generated in a scintillating crystal. The system employs a specific geometric arrangement, respecting laws of refraction, to focus scintillation light onto a detector with high spatial resolution, even when the beam spot is smaller than the crystal thickness. Variants include using lenses, mirrors, and a partial Schwarzschild objective to achieve high resolution, avoid interference from optical transition radiation, and provide flexible, robust detection for high-energy beam monitoring.

Use CasesContent extracted from patent full text and abstract with AI.

• Monitoring and profiling X-ray or electron beams in free electron laser facilities
• High-resolution imaging of small high-energy particle beams in research accelerators
• Non-invasive diagnostics in particle physics experiments
• Beam alignment and optimization in medical radiotherapy equipment
• Real-time quality assurance of synchrotron or accelerator beams
• General beam instrumentation for advanced scientific or industrial radiation sources

BenefitsContent extracted from patent full text and abstract with AI.

• Enables high-resolution imaging of beams smaller than the scintillating crystal thickness
• Avoids signal degradation from optical transition radiation, ensuring accurate measurements
• No central obscuration, allowing efficient use of commercial CCD/CMOS detectors with microlens arrays
• Achromatic (color-independent) imaging possible over a wide wavelength range due to mirror-based designs
• Supports large working distances, protecting detectors from radiation and allowing for vacuum windows
• Flexible system design with lens or mirror optics, including use of standard spherical mirrors
• Facilitates reliable, spatially resolved, and high-sensitivity beam profile measurements necessary for modern accelerator facilities

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Patent Abstract

The present invention discloses a first optical system to image visible scintillating light generated by an ionizing radiation beam on a scintillating crystal in medium having a first refractive index n 1 , comprising: a) the scintillating crystal having a second refractive index n 2 , said crystal being oriented that an angle ± of the ionizing radiation beam and an angle ² of the optical axis of the scintillating light both relative to the normal of the surface of the scintillating crystal observe the refraction law n 1 sin(±) = n 2 sin (²) ; b) imaging optics for the scintillating light being disposed downstream of the scintillating crystal; and c) a position sensitive detector for a spatially resolved imaging of the scintillating light being disposed downstream of the imaging optics; wherein the imaging optics, such as a lens, and the position sensitive detector are oriented that a common intersection of the planes of the scintillating crystal, the imaging optics and the position sensitive detector is established. A second optical system similar to the first one comprises a significant part a mirror for reflecting the scintillating light in a direction substantially perpendicular to the direction of the ionizing radiation beam; said mirror being disposed downstream of the scintillating crystal. The other parts are identical to the respective parts of the first optical system.