Arrangement for Omnidirectional Scattering Imaging

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This invention introduces a new arrangement for X-ray scattering imaging that enables simultaneous acquisition of scattering images in all directions in a single shot. The system uses a specialized optical element with a circular, diffractive structure that does not require high coherence in the X-ray source or extremely high detector resolution. It can be used with standard (even polychromatic) X-ray sources and is suitable for imaging fine microstructures within samples, providing absorption, phase contrast, and omnidirectional small-angle scattering information without mechanical scanning or sample rotation.

Use CasesContent extracted from patent full text and abstract with AI.

• Medical imaging, such as enhanced diagnosis using X-ray scattering signatures (e.g., mammography, soft tissue analysis)
• Industrial non-destructive testing of materials for microstructural integrity (e.g., composite fibers, welds, ceramics)
• Pharmaceutical research for analyzing internal structures in tablets or other formulations
• Forensics, for detailed analysis of the internal microstructure of objects
• Research in material science to investigate properties linked to microstructure, such as crystallinity or fiber orientation
• Biological studies, such as imaging of bone, tissue, or plant microstructure without destroying the sample

BenefitsContent extracted from patent full text and abstract with AI.

• Provides omnidirectional scattering images in a single shot without requiring sample or system rotation
• Works with standard X-ray sources, removing the need for synchrotrons or specialty (highly coherent) sources
• Reduces technical complexity and increases speed by eliminating complex scanning steps
• Relaxed detector requirements allow use with lower-resolution or conventional X-ray detectors
• Facilitates new forms of quantitative analysis (absorption, phase contrast, and directional scattering) simultaneously
• Improves practicality and accessibility of detailed X-ray microstructure imaging for clinical, industrial, and research applications

Technical Classifications (CPCs)

Inventors & Applicants

Patent Abstract

X-ray scattering imaging can provide complementary information about the unresolved microstructures of a sample. The scattering signal can be accessed with various methods based on coherent illumination, which span from self-imaging to speckle scanning. The directional sensitivity of the existing methods is limited to a few directions on the imaging plane and it requires the scanning of the optical components, or the rotation of either the sample or the imaging setup, if the full range of possible scattering directions is desired. Recently such an invention has been presented. However, the method requires a very high resolution and is only applicable to imaging setups where this is possible, such as synchrotron facilities. The present invention discloses a new arrangement that allows the simultaneous acquisition of the scattering images in all possible directions in a single shot without the need of high resolution or highly coherence sources. This is achieved by a specialized optical element and means of recording the generated fringe with sufficient spatial resolution.