Device for Non-Fully Intercepting Sensor Monitors for Ionizing Beams

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This invention relates to an advanced device for monitoring ionizing radiation beams, specifically X-ray or particle accelerator beams, using a Silicon Carbide (SiC) plate with central openings (holes). Unlike traditional monitors that fully intercept the beam, this design allows the central, most intense part of the beam to pass through untouched, while only the outer parts (tails) are partially absorbed for measurement. Additional design features, such as radial incisions, multiple hole sizes, and layered detection, further optimize its performance under high-radiation conditions, reducing heating and beam interference.

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• Online monitoring of high-intensity X-ray beams in synchrotron and free-electron laser facilities without disrupting experiments.
• Continuous beam alignment and position tracking in particle accelerators or X-ray sources.
• Soft X-ray and white beam applications where traditional solid-state detectors are affected by overheating or excessive absorption.
• Precise measurement of the spatial structure, center, and energy distribution of ionizing radiation beams for research and industrial purposes.
• Replacement of diamond-based beam monitors with a lower-cost, robust solution in various scientific facilities.
• Beam diagnostics and safety monitoring in medical radiation equipment and nuclear physics experiments.

BenefitsContent extracted from patent full text and abstract with AI.

• Dramatically reduces sensor heating by allowing the beam's central portion to pass through, avoiding overheating and prolonging device life.
• Minimizes interference with the beam, supporting continuous, non-disruptive monitoring during experiments.
• Provides higher electrical signal output and better spatial/energy resolution than conventional blade or diamond monitors.
• Supports fast response and stable long-term operation, even at high radiation fluxes.
• Allows for zero-bias operation and efficient cooling, especially via direct copper contact, enhancing reliability in intense beam environments.
• Can discriminate between low and high photon energies using layered sensor design, enabling advanced diagnostic functions.
• Manufactured at lower cost compared to single-crystal or polycrystalline diamond detectors, with flexible and precise geometrical customization.

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Patent Abstract

It is the objective of the present invention to provide a device for intercepting and monitoring ionizing beams showing a reduction of heat loads (and thus the operating temperature) and a reduction of the beam interference in semiconductor-based beam monitors under ionizing radiations.This objective is achieved according to the present invention by an ionizing radiation beam monitor comprising a Silicon Carbide plate having a plurality of electrodes, wherein said Silicon Carbide plate comprises at least one hole in the center.By the provision of these micron or mm-sized openings through the semiconductor monitor, the central part of the beam is fully transmitted without any interference with the Silicon Carbide layer whereas the tails of the beam are partially or totally absorbed to obtain the desired information about the beam characteristics.