A System and a Method for Resolving a Crystal Structure of a Crystal at Atomic Resolution by Collecting X-Ray Diffraction Images
Simple SummaryContent extracted from patent full text and abstract with AI.
This invention describes an automated system and method for determining the atomic structure of crystals (such as proteins) by collecting X-ray diffraction images using a novel setup. The method involves suspending tiny droplets containing crystals in mid-air using an ultrasonic acoustic levitator, then subjecting them to X-rays while monitoring and capturing high-speed diffraction data. This process allows rapid, non-freezing, and highly efficient analysis of fragile or difficult crystals, providing detailed atomic-resolution structural information.
Use CasesContent extracted from patent full text and abstract with AI.
- High-throughput protein crystallography for drug development and biological research
- Structure determination of fragile or radiation-sensitive macromolecular crystals
- Room-temperature crystallography for studying biomolecules in near-physiological conditions
- Time-resolved studies of molecular conformations and protein dynamics
- Screening crystal samples automatically and efficiently in research laboratories
- Materials science research, analyzing synthetic or inorganic crystals
- Studying ligand binding and conformational changes through real-time structural monitoring
BenefitsContent extracted from patent full text and abstract with AI.
- Enables rapid, automated acquisition of atomic-resolution diffraction data
- Reduces sample damage by enabling data collection at high speeds and room temperature
- Allows multiple crystal orientations to be captured efficiently without manual manipulation
- Eliminates the need for freezing samples, preserving natural conformational states
- Minimizes sample waste and increases throughput through automation and precise sample delivery
- Permits dynamic studies (e.g., conformational changes, ligand binding) in real time
- Improves experimental flexibility by allowing temperature, humidity, and chemical control during measurement
Technical Classifications (CPCs)
Main Classifications
Manufacturing & Transport
Physics & Measurement
Sub Classifications
Measuring & Testing
Musical Instruments & Acoustics
Physical & Chemical Processes
CPC Codes
Inventors & Applicants
Inventors
Applicants
Scherrer Inst Paul
Patent Abstract
The present invention discloses a method and a system (2) for resolving a crystal structure of a crystal (4) at atomic resolution by collecting X-ray diffraction images, comprising: a) ejecting a droplet (8) of fluid comprising single or multiple of crystal (4) into an ultrasonic acoustic levitator (6); b) levitating said droplet (8) of fluid comprising said crystal (4) in an ultrasonic acoustic levitator (6); b) monitoring the position and the spinning of the droplet (8) with a visualization apparatus; c) applying X-ray (20) to said crystal (4), said X-ray (20) stemming from an X-ray source (34); and d) detecting the X-ray diffraction images (24) from the said crystal (4) irradiated by the said X-ray source (34) by an X-ray detector (36) being capable to capture two dimensional diffraction patterns.
Key Information
Publication No.
EP3173774A1
Family ID
54705019
Publication Date
2017-05-31
Application No.
EP15195946A
Application Date
2015-11-24
Priority Date
2015-11-24
Granted
Yes (5/12)
Possible Cooperation
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