Stimulated Scintillation Emission Depletion (ssed) for High-Resolution Quantitative X-Ray Nanoimaging

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This invention introduces a high-resolution X-ray nanoimaging method and apparatus using 'stimulated scintillation emission depletion' (SSED). By employing a specialized light (de-excitation light) to control light emission from a luminescence screen irradiated by X-rays, the system can produce images with spatial resolution beyond the traditional diffraction limit. This approach allows for much finer imaging of an object's internal structures compared to conventional X-ray imaging systems.

Use CasesContent extracted from patent full text and abstract with AI.

• Nondestructive 3D imaging of micro- and nano-scale structures in materials science.
• High-resolution imaging for biological and medical research (e.g., observing tissue microarchitecture or cell morphology).
• Advanced inspection and quality control in the semiconductor and electronics industries.
• Characterization of nanomaterials, composite structures, and advanced manufacturing processes.
• Research applications requiring quantitative analysis of internal features at the nanoscale.

BenefitsContent extracted from patent full text and abstract with AI.

• Significantly improves spatial resolution of X-ray images beyond the diffraction limit of scintillation emission.
• Enables quantitative, high-resolution 2D and 3D imaging of internal structures at the nanoscale.
• Allows use of standard, commercially available luminescence screens, reducing cost and complexity.
• Applicable to a wide range of X-ray sources and sample types.
• Offers higher efficiency and flexibility compared to previous methods by managing emission properties with external light.
• Facilitates nondestructive imaging, preserving sample integrity.

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Patent Abstract

The present invention suggests a new method for generating high spatial resolution X-ray images of an object. Differently than other existing X-ray imaging setups, our configuration employs stimulated scintillation emission depletion and improves the spatial resolution beyond the diffraction limit of conventional scintillation emission. In our new method, X-rays (2) passing through an object (3) are partially absorbed by a luminescence screen (5). The emission of the luminescence screen (5) generates an image of the object (3). A de-excitation light (8) comprising zero-intensity point in at least one focal area is applied to the luminescence screen (5). This light de-excites the excited luminescence centers leaving sub-diffraction sized spots of the spontaneously emitted scintillation. The image of the object (3) in the luminescence screen (5) is scanned, and a two-dimensional X-ray image of one projection is reconstructed. By measuring different two-dimensional projections, a three-dimensional image of the object (3) is reconstructed.