Topographically Structured Support for Electron Crystallography

Simple SummaryContent extracted from patent full text and abstract with AI.

This patent introduces a specially designed sample support for electron crystallography and similar imaging techniques. The support surface has a 3D, ridge-like or terrace-like topography with features sized to match submicron samples. This irregular, three-dimensional surface forces deposited crystals or particles to adopt random, varied orientations—overcoming the common problem where crystals align in preferred (and limiting) orientations on flat supports. The invention describes specific implementations such as wrapped carbon films or networks of nanofibers (e.g. nylon), and enables more complete, high-quality structural datasets to be collected with fewer samples.

Use CasesContent extracted from patent full text and abstract with AI.

• Transmission electron microscopy (TEM) of nanocrystals or submicron samples for structural biology or materials science.
• Electron diffraction studies where full 3D data of small crystals is necessary, such as in drug development or catalyst research.
• Single-particle imaging and reconstruction of proteins, viruses, or inorganic materials at the nanometer scale.
• Sample preparation for cryo-electron microscopy (cryo-EM) or tomography, where random orientation of particles improves result quality.
• High-throughput or automated TEM sample runs, simplifying sample preparation and increasing data completeness.
• Hybrid techniques combining electron and X-ray crystallography for difficult-to-crystallize substances.

BenefitsContent extracted from patent full text and abstract with AI.

• Prevents preferred orientation of samples, thereby eliminating the 'missing wedge' problem and increasing dataset completeness.
• Enables acquisition of full three-dimensional structural data from fewer crystals—making studies more efficient and less sample-intensive.
• Applicable to a wide variety of sample types (both crystalline and non-crystalline) and sizes in the submicron range.
• Easy and scalable preparation methods (e.g. brushing carbon films, depositing nanofibers), allowing adaptation to different experimental needs.
• Improves the reliability and precision of molecular and atomic structure determination, benefiting areas like protein structure analysis and materials characterization.
• Facilitates broader and more accurate use of electron crystallography in cases where conventional supports fail.

Technical Classifications (CPCs)

Inventors & Applicants

Patent Abstract

It is therefore the objective of the present invention to provide a sample support that enables for example sub-micro range crystals to be deposited on the sample support in an arbitrary orientation although the crystals might have a preferred orientation.This objective is achieved according to the present invention by a sample support for samples in the submicron range in imaging and diffraction techniques, comprising a topographically modulated surface; said surface comprising ridge-like and terrace-like structures having dimensions in the order of magnitude to the size of the submicron-sized sample.Therefore, the topographical structure of ridge-like and terrace like section prevents the 3D crystalline probes from the deposition in a preferred direction due to the shape of the crystal structure on the probe support.