Sample Holder for the Examination of Small Samples Present in a Suspension

Simple SummaryContent extracted from patent full text and abstract with AI.

This invention provides a specialized sample holder designed for analyzing small particles suspended in a liquid, using X-rays or electron beams. The holder is made from a thin single-crystal substrate with parallel surfaces and features precisely arranged through-holes extending perpendicularly between its surfaces. This enables effective examination of tiny samples within suspensions.

Use CasesContent extracted from patent full text and abstract with AI.

• High-resolution imaging of nanoparticles in fluid suspensions using electron microscopy
• Preparation of biological or chemical samples for X-ray analysis
• Material science studies requiring analysis of suspended particulate matter
• Quality inspection in manufacturing processes involving fine powders or particles in fluids
• Pharmaceutical research, such as analyzing drug particles in suspension

BenefitsContent extracted from patent full text and abstract with AI.

• Allows precise and stable positioning of small suspended particles for analytical imaging
• Minimizes background interference thanks to the single-crystal substrate
• Facilitates the use of advanced imaging techniques like X-ray and electron microscopy
• Improves the reliability and reproducibility of experiments with small, dispersed samples
• Can accommodate extremely small sample volumes, reducing material costs

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Inventors & Applicants

Patent Abstract

A sample holder for the examination of small particles contained in a suspension using X-rays or electron beams is depicted and described, wherein the sample holder includes a single-crystal substrate extending in a plane, the dimensions of which in the plane are several times larger than the dimensions perpendicular to the plane, wherein the substrate includes a first and a second surface, which run parallel to the plane, and wherein the substrate includes through-holes, which extend perpendicular to the plane and which run from the first to the second surface.