Source-detector arrangement for X-ray phase contrast imaging and method therefor
Simple SummaryContent extracted from patent full text and abstract with AI.
The patent describes an innovative X-ray phase contrast imaging system that uses a special source-detector arrangement. Rather than relying on complex mechanical gratings, it employs a bundled and controllable electron beam, which is precisely manipulated by electrode plates to scan across an anode in a patterned fashion. This approach enables the direct generation of an array of quasi-coherent X-rays, improving the phase contrast imaging process. The setup may involve specially structured anodes (with different materials or surface profiles) and/or electronic methods (like movable electron masks) to create the necessary radiation pattern. The system can be integrated into various X-ray apparatuses, such as CT scanners, to acquire higher-contrast images, especially useful for soft tissue differentiation.
Use CasesContent extracted from patent full text and abstract with AI.
- Medical imaging, particularly for soft tissue visualization in X-ray or CT scanners where phase contrast is crucial (e.g. mammography, brain scans, cardiovascular imaging).
- Preclinical and biological research to study tissue microstructure or cellular contrast with minimal tissue absorption.
- Non-destructive testing (NDT) in materials science and industrial inspection to detect tiny cracks or composition differences in low-absorption materials.
- Security screening systems requiring enhanced image contrast for low-density or overlapping materials.
- Research and development of advanced X-ray imaging systems for specialized scientific investigations.
BenefitsContent extracted from patent full text and abstract with AI.
- Increased image contrast and clear differentiation of soft tissues compared to conventional X-ray absorption imaging.
- Lower radiation dose to patients due to improved radiation utilization, reducing unnecessary exposure.
- Faster and more precise phase-contrast image acquisition by avoiding mechanical movement of physical gratings.
- Improved reliability and system lifetime due to the lack of moving mechanical parts (electronic scanning instead).
- Versatility with potential integration into various X-ray modalities (such as CT, C-arm, or projection imaging systems).
- Greater efficiency in heat dissipation and X-ray production by specially designed anode structures.
Technical Classifications (CPCs)
Main Classifications
Health, Food & Consumer Tech
Sub Classifications
Medical & Vet Science
CPC Codes
Inventors & Applicants
Inventors
Applicants
Siemens Ag
Paul Scherrer Inst Psi
Patent Abstract
A bundled electron beam (BEB) (14) is controlled regarding its excursion in its direction by two pairs of plate electrodes (17.1,17.2;18.1,18.2) that operate vertically to each other. The BEB can use appropriate control of these plate electrodes to scan an anode (16) like scanning a TV picture line by line with a desirable gap and, as a result, can generate desired X-rays. Independent claims are also included for the following: (1) An X-ray system for generating projective phase-contrast exposures; (2) A method for generating projective or tomographic X-ray phase-contrast exposures of an object under examination with the help of a focus-detector system.
Key Information
Publication No.
EP1803398A1
Family ID
37770347
Publication Date
2007-07-04
Application No.
EP06016644A
Application Date
2006-08-09
Priority Date
2005-12-27
Granted
Yes (3/6)
Possible Cooperation
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