System for obtaining quantitative x-ray images using Hilbert transform on imaged fringes

Simple SummaryContent extracted from patent full text and abstract with AI.

This invention presents an improved X-ray phase contrast imaging system that uses only a single grating to simultaneously capture absorption, differential phase, and small-angle scattering information from a sample. It eliminates the need for tedious mechanical movements found in traditional phase-stepping methods by leveraging high-resolution detectors capable of single-photon sensitivity. The system records fine interference fringe patterns and analyzes them using a phase retrieval technique based on the Hilbert Transform, easily extracting multiple image contrasts in a single shot.

Use CasesContent extracted from patent full text and abstract with AI.

• Medical imaging for soft tissue visualization, such as mammography or tumor detection
• Materials science for detailed analysis of internal structures
• Non-destructive testing of industrial components for defects or stresses
• Analysis of biological or organic samples in research settings
• Security scanning applications for detecting concealed items or substances
• Pharmaceutical quality control for inspecting packaging and contents

BenefitsContent extracted from patent full text and abstract with AI.

• Simultaneous acquisition of absorption, phase, and scattering images, providing richer diagnostic or analytic information
• Single-shot operation without mechanical phase stepping, making the system faster, simpler, and less susceptible to vibrations or mechanical errors
• Higher sensitivity and resolution, enabling fine structural details to be captured using detectors with micrometer-scale effective pixels
• Improved photon utilization and dose efficiency, which is critical for medical imaging and reducing patient exposure
• Simplified hardware setup by removing the need for a second grating and mechanical scanning mechanisms
• Versatility to work with both 1D and 2D grating configurations and adaptable to various detector technologies

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Patent Abstract

The invention is concerning grating based X-ray phase contrast imaging. More specifically, the invention is a single shot, single grating (phase) method capable of obtaining differential phase contrast, absorption and scattering images of a sample simultaneously. This is achieved by utilizing high resolution which is provided by single photon sensitivity of charge integrating detectors (with pixel sizes in the 10-50 µ m range) or like. The high resolution (approx. 1 µ m) allows the recording of the interference fringe (Talbot effect) that is created by a phase or absorption grating 1D or 2D. Once the fringe has been recorded a phase retrieval method based on the Hilbert Transform (HT) was developed in order to retrieve the three aforementioned images. The phase retrieval method provides average phase values (also absorption and scattering) for each pixel or area of the detector.