X-ray CT System for Generating Tomographic Phase Contrast or Dark-field Images

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This patent describes an x-ray CT system equipped with a special interferometer that enables the generation of tomographic images based on phase contrast or dark field imaging techniques. The system employs a modular arrangement of special grating structures, allowing the setup to be adapted based on the angle of the x-ray beam (fan angle), resulting in improved image quality and flexibility.

Use CasesContent extracted from patent full text and abstract with AI.

• Medical imaging for early detection of soft tissue abnormalities
• Non-invasive diagnostics for diseases where conventional x-rays have limitations, such as detecting cancer or microfractures
• Material analysis for research and development, especially for low-density or multi-layered materials
• Inspection and quality control in manufacturing, such as detecting defects in composite materials
• Preclinical research in biomedical fields using enhanced imaging contrast

BenefitsContent extracted from patent full text and abstract with AI.

• Provides higher contrast imaging compared to conventional x-ray CT, especially for soft tissue
• Allows detection of subtle structural differences and microstructural details that standard CT may miss
• Modular and adaptable system design enhances flexibility for different imaging needs and geometries
• Can improve diagnostic accuracy and potentially lead to earlier disease detection
• Supports new applications in medical, industrial, and research environments through improved imaging capabilities

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Patent Abstract

An x-ray CT system that generates tomographic phase contrast or dark field exposures, has at least one grating interferometer with three grating structures arranged in series in the radiation direction, with a modular design of the second and third grating structures. The distance between the first grating structure of the x-ray source and the second grating structure (fashioned as a phase grating) of the respective grating/detector modules is adapted, depending on the fan angle, corresponding to a period of the grating structure of the x-ray source projected onto the grating detector module at a respective fan angle (φi).