Single photon counting detector system having improved counter architecture

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This invention describes an advanced single photon counting detector system that enhances the ability to detect and count individual photons, particularly in X-ray applications. The core innovation is the improved counter architecture in each pixel, allowing for multiple digital counters with individual thresholds and selective timing gates. This design enables more accurate detection at high photon rates, better differentiation between photon energies, and improved support for specialized measurement techniques such as pump and probe experiments.

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• X-ray imaging in scientific research (e.g., synchrotron facilities, materials science, crystallography)
• High-resolution and high-rate X-ray detection for non-destructive testing in industry
• Advanced pump and probe measurements for studying ultrafast processes in materials
• Medical X-ray imaging systems requiring precise photon counting
• Detection of specific energy windows for improved background suppression in analytical instruments
• Synchrotron beamline detectors handling very high photon rates

BenefitsContent extracted from patent full text and abstract with AI.

• Significantly increased photon count rate capability, reducing lost counts at high rates (up to about double current technologies)
• Ability to perform dead-time free or nearly continuous measurements for dynamic and time-resolved experiments
• More accurate discrimination between photon energies, allowing for spectral filtering or background reduction
• Enhanced support for pump and probe measurements by enabling simultaneous counting of multiple probe intervals
• Flexible readout (per pixel or parallel pixel groups), leading to faster data acquisition and more efficient multiplexing
• Individually adjustable thresholds per pixel improve uniformity and systematic correction capability
• Versatility to operate under various experimental conditions, including laboratory and synchrotron environments

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Patent Abstract

The present invention relates to a single photon counting detector system (14), comprising: a) a layer of photosensitive material (4); b) an N×M array of photo-detector diodes (2) arranged in said layer of photosensitive material (4); each of said photo-detector diodes (2) having a bias potential interface (12) and a diode output interface, said bias potential interface (12) of each photo-detector diode (2) being connected to a bias potential (V bias ) ; c) an N×M array of high gain, low noise readout unit cells (RO), one readout unit cell (RO) for each photo-detector diode (2); d) each readout unit cell (RO) comprising: d1) an input interface (IN) connected to said diode output interface, a high-gain voltage amplifying means (amp) comprising an integration capacitor (Cint), d2) at least two parallel lines of digital counters, d3) each line comprising a comparator having an individually selectable threshold (threshold1, threshold2) and a gateable section (gate1, gate2) to determine the counting intervals of the digital counters. e) a multiplexing means allowing to access the readout cell unit either on a per pixel basis or for several pixels in parallel to read out the digital counter to a data processing means transfering the data off the chip to the data processing means, in particular external readout electronics which do not form an integral part of the readout unit cells