Segmented electrical or optical delay line with interleaved tap for 3D image device readout

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This patent discloses a novel imaging device using segmented electrical or optical delay lines with interleaved taps for highly accurate and rapid readout of single event images. The device allows two pulses, generated by an incident particle or photon, to propagate in opposite directions along a segmented delay line. By placing multiple measurement points (taps) along the delay line and connecting them to precise Time-to-Digital Converters, the system can determine both the position and timing of the single event with high spatial and temporal resolution. This architecture minimizes signal distortions and improves the speed (framing rate) and accuracy beyond existing camera and detector technologies.

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• Time-sensitive particle or photon detection in particle physics, mass spectrometry, and coincidence measurements.
• 3D imaging in scientific cameras for astronomy, life sciences, and materials analysis requiring precise localization and timing of single events.
• Single photon or particle counting and ranging for industrial, medical, or research instrumentation.
• High-speed data acquisition in situations where information from only a few pixels with events needs to be captured instantly rather than scanning a full frame, such as in high-throughput detectors or event-driven imaging systems.
• Integration with optical or electron-based detectors for applications like X-ray imaging, nuclear research, or advanced microscopy.

BenefitsContent extracted from patent full text and abstract with AI.

• Greatly increased spatial and temporal resolution (down to 1 ns and 30 µm claimed) compared to standard CCD and CMOS detectors.
• Significantly higher framing rates, allowing for the capture of events at MHz scales, which is crucial for fast processes and experiments.
• Reduced readout time and improved efficiency, as the system reads only the relevant pixels where events occur rather than the entire image frame.
• Elimination or mitigation of common distortions such as edge effects through the use of segmented and interleaved measurement points along the delay line.
• Flexibility to use either electrical or optical delay lines, enabling adaptation to various experimental setups, including those requiring rugged or vacuum-compatible detectors.
• Enhanced multi-hit capability, allowing detection of coincident events without interference, which is valuable for complex scientific studies.
• Potential for cost-effective and more compact detector designs compared to fully instrumented pixel arrays.

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Patent Abstract

It is the aim of the present invention to provide a single-event imaging device fulfilling the specific needs in terms of high spatial and time resolution and high framing rates. This aim is achieved according to the present invention by a single event imaging device, comprising: a) at least one delay line (DL) assigned to an image plane (IP); said delay line (DL) allowing two pulses to propagate in opposite directions along the delay line (DL), said two pulses being generated by the impingement of the single-event (e - , h½) at an impingement position; b) a number of interleaved measurement points (MP1 to MPn) associated with said delay line (DL); said interleaved measurement points (MP1 to MPn) dividing the delay line (DL) into a number of delay line segments (DL1 to DLn); and c) a number of Time-to-Digital convertors (TDC 1 to TDC n ) to detect the arrival time of the pulses at distinct measurement points (MP1 to MPn). Using the delay line in a segmented manner by disposing various interleaved measurement points along the delay line allows to eliminate any distortions incurred by edge effects while simultaneously obtaining the advantage of a shortened delay line in form of logically separated delay line segments allowing an excellent trade-off in terms of spatial resolution and framing rate.