Omnidirectional Scattering- and Bidirectional Phase-Sensitivity with Single Shot Grating Interferometry

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This invention describes an X-ray imaging system that can simultaneously capture scattering, phase, and absorption images of a sample in all directions with a single exposure. By using a specially designed two-dimensional phase grating with circular or hexagonal patterns and a high-resolution detector, this method enables omnidirectional detection of microstructural features without needing to rotate or move the sample or any optical components. This approach provides faster and more detailed quantitative imaging, especially of fine internal structures, using X-rays.

Use CasesContent extracted from patent full text and abstract with AI.

• Medical imaging for tissues with complex microstructures (e.g., breast or lung imaging)
• Non-destructive testing and quality control in industrial settings (e.g., composites, microelectronics)
• Material science research to analyze anisotropic or intricate sub-micron features in samples
• Tomographic imaging applications for 3D structure reconstruction
• Security screening where rapid, detailed analysis of internal contents is required

BenefitsContent extracted from patent full text and abstract with AI.

• Captures scattering images in all directions with a single exposure (single shot), saving time and reducing complexity
• Eliminates the need for mechanical rotation or scanning, reducing experimental error and increasing throughput
• Detects fine, unresolved microstructures beyond traditional absorption-based imaging capabilities
• Provides multiple contrast images (absorption, phase, scattering) simultaneously, offering more comprehensive sample characterization
• Simplifies device setup and operation, increasing accessibility and reliability for medical and industrial users

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Patent Abstract

X-ray scattering imaging can provide complementary information about the unresolved microstructures of a sample. The scattering signal can be accessed with various methods based on coherent illumination, which span from self-imaging to speckle scanning. The directional sensitivity of the existing methods is limited to a few directions on the imaging plane and it requires the scanning of the optical components, or the rotation of either the sample or the imaging setup, if the full range of possible scattering directions is desired. The present invention discloses a new arrangement that allows the simultaneous acquisition of the scattering images in all possible directions in a single shot. This is achieved by a specialized phase grating and means of recording the generated interference fringe with sufficient spatial resolution. The proposed technique decouples the sample dark-field signal with the sample orientation, which can be crucial for medical and industrial applications.