Arrangement and method for projective and/or tomographic phase-contrast imaging using X-ray radiation

Simple SummaryContent extracted from patent full text and abstract with AI.

This invention describes a new arrangement and method for X-ray imaging that uses phase-contrast techniques. By placing one or more phase grids in the beam path and rotating the X-ray source, the system captures images from different grid orientations. This allows accurate measurement and mapping of phase shifts (related to refraction within the object), which provides detailed projective or tomographic images of the object's internal structure.

Use CasesContent extracted from patent full text and abstract with AI.

• Medical imaging for soft tissue structures that are difficult to visualize with conventional X-rays
• Non-destructive testing in industrial applications to detect defects or internal features in materials
• High-resolution imaging in materials science research
• Preclinical and biomedical research requiring detailed internal images of small animals or samples

BenefitsContent extracted from patent full text and abstract with AI.

• Improved contrast and image quality, especially for soft tissues or low-density materials
• Ability to capture complete phase shift information for more accurate diagnostic results
• Non-destructive and non-invasive method, suitable for sensitive or valuable subjects
• Potential to reduce the X-ray dose needed while maintaining image detail
• Enables both projection and tomographic (3D) imaging

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Patent Abstract

An arrangement and a method are disclosed for projective and/or tomographic phase-contrast imaging using X-ray radiation. In at least one embodiment, one or more phase grids is/are arranged in the beam path such that during a rotation of the at least one X-ray source, the examination object is scanned with different spatial orientations of the grid lines relative to the examination object such that the complete refraction angle, and hence the complete phase shift gradient, can be determined for each X-ray beam from the two scans with differently oriented phase grids in order to be able to show the phase shift of an examination object in terms of projections or in a tomographic image.