Method and Apparatus for Carrying Out a Time-Resolved Interferometric Measurement

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This invention provides a method and apparatus for conducting time-resolved interferometric measurements, such as those used in electron holography and similar applications. It works by generating at least two coherent waves, overlapping them to create an interference pattern, then deliberately disturbing the pattern during certain time segments within a long exposure. By filtering out the data corresponding to these intentionally disturbed segments, the method allows for extraction of meaningful amplitude and phase information only from the undisturbed segments. This approach significantly enhances time resolution without reducing the total exposure time or data quality.

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• Advancing time-resolved electron holography for studying fast dynamic processes at nanoscales.
• Improving transmission electron microscopy to observe temporal changes in materials, biological samples, and devices.
• Employing the method in optical interferometry for high-speed phase and amplitude measurements.
• Applying to acoustic or pressure wave interferometry to study fast phenomena in fluids or solids.
• Enhancing atomic-scale or molecular imaging techniques that require both high sensitivity and temporal resolution.

BenefitsContent extracted from patent full text and abstract with AI.

• Provides higher time resolution measurements even with inherently long exposure times.
• Maintains signal-to-noise ratio by using data only from undisturbed time segments, minimizing noise impact.
• Allows real-time observation of dynamic processes previously inaccessible due to temporal limitations.
• Is versatile and adaptable to various types of coherent waves (electron, optical, acoustic, etc.).
• Reduces artifacts in interferometric imaging by systematically filtering out disturbed or noisy data.
• Enables more accurate and detailed analysis of physical, biological, and chemical processes.

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Patent Abstract

An embodiment of the invention relates to a method for carrying out a time-resolved interferometric measurement comprising the steps of generating at least two coherent waves, overlapping said at least two coherent waves and producing an interference pattern, measuring the interference pattern for a given exposure time, thereby forming measured interference values, and analyzing the measured interference values and extracting amplitude and/or phase information from the measured interference values. In at least one time segment, hereinafter referred to as disturbed time segment, of the exposure time, the interference pattern is intentionally disturbed or destroyed such that the corresponding measured interference values describe a disturbed or destroyed interference pattern. In at least one other time segment, hereinafter referred to as undisturbed time segment, of the exposure time, the interference pattern is undisturbed or at least less disturbed compared to the disturbed time segment such that the corresponding measured interference values describe an undisturbed or less disturbed interference pattern. The measured interference values that were measured during the entire given exposure time, are filtered, wherein those interference values that were measured during the at least one disturbed time segment, are reduced, suppressed or discarded. The filtered interference values are analyzed and the amplitude and/or phase information is extracted from the filtered interference values.