Method for controlling texture goniometer in context of texture-analytic testing of sample, involves carrying out multiple diffractometric luminosity measurement at sample in multiple measuring passageway

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This patent describes a method and device for controlling a texture goniometer during texture analysis of crystalline samples using diffractometric (e.g. X-ray) measurements. Instead of using a fixed, regular measurement grid, the method employs adaptive measurement grids: initial measurements are used to identify regions of interest, which are then measured with higher resolution in subsequent rounds. This approach iteratively refines the data collection process, focusing on critical areas, thereby improving measurement efficiency and accuracy. The invention also includes optimized algorithms for controlling the measurement device based on interim measurement results.

Use CasesContent extracted from patent full text and abstract with AI.

• Quality control in metal or ceramic production, by rapidly analyzing texture and orientation in polycrystalline materials
• Advanced materials research, for efficient data collection in crystallography experiments
• Industrial or academic X-ray diffraction (XRD) labs aiming for faster or more detailed texture analysis
• Geological or mineralogical studies to examine orientation distributions in rock or mineral samples
• Non-destructive testing and analysis in aerospace, automotive, or electronics manufacturing

BenefitsContent extracted from patent full text and abstract with AI.

• Substantially reduced measurement time compared to traditional fixed-grid methods
• Improved accuracy and resolution in critical or interesting regions of the sample
• Adaptive, data-driven measurement means fewer redundant measurements and better use of laboratory resources
• Suited for modern, automated diffractometry setups
• Highly effective for analyzing sharp textures or technical single crystals that require high spatial resolution
• Reduces instrument wear and operational costs by optimizing measurement sequences

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Patent Abstract

The method involves carrying out multiple diffractometric luminosity measurement at a sample in multiple measuring passageways. A luminosity value is determined in a measuring passageway for each measuring position of multiple measuring positions within a measuring area. The shape of a subarea of a measuring area is determined based on the determined luminosity values. The texture goniometer is controlled using the determined measuring positions. An independent claim is also included for a device for controlling a texture goniometer in the context of a texture-analytic testing of a sample.