Lift-Out Sample Holder

Simple SummaryContent extracted from patent full text and abstract with AI.

The invention is a specialized sample holder designed to securely hold cylindrical cross-sections or slices of material samples, particularly those with a polished surface, for microscopic analysis. It features the capability to attach one or more TEM (Transmission Electron Microscopy) grids so that thin lamellae prepared from the sample can be mounted and analyzed under an electron microscope.

Use CasesContent extracted from patent full text and abstract with AI.

• Preparation and analysis of material samples with polished surfaces for electron microscopy.
• Use in research laboratories needing precise handling of TEM lamellae samples.
• Quality control in manufacturing industries examining microstructures in metals, semiconductors, or ceramics.
• Educational settings for teaching advanced microstructural analysis techniques.

BenefitsContent extracted from patent full text and abstract with AI.

• Provides secure and precise mounting of sample slices, reducing risk of sample damage.
• Facilitates easier and more efficient preparation of electron microscopy samples.
• Improves accuracy and repeatability in sample analysis.
• Can handle different types of samples, increasing versatility in laboratory settings.

Technical Classifications (CPCs)

Inventors & Applicants

Patent Abstract

Lift-Out-Probenhalter mit einem Grundkörper, zur Aufnahme eines insbesondere zylindrischen Querschliffs mit einer polierten Fläche einer zu untersuchenden Probe, wobei an dem Probenträger wenigstens ein TEM-Netzchen zur Aufnahme von TEM-Lamellen befestigbar ist.