Signal Processing Circuit and Measurement System

Simple SummaryContent extracted from patent full text and abstract with AI.

This patent describes a method for manufacturing an electric circuit in which a resistor structure and contact points are accurately formed on a substrate. Through a special process involving test signals, the resistor is precisely adjusted (trimmed) to meet specific electrical properties, ensuring accurate circuit performance.

Use CasesContent extracted from patent full text and abstract with AI.

• Precision manufacturing of printed circuit boards for electronics
• Production of sensors and measurement circuits where exact resistance values are crucial
• Manufacture of high-reliability medical devices requiring tight electrical tolerances
• Automated quality control during circuit production in semiconductor fabrication
• Development of customized resistive elements for scientific instrumentation

BenefitsContent extracted from patent full text and abstract with AI.

• Improves the accuracy and reliability of electric circuits
• Reduces manual adjustments and increases automation in circuit manufacturing
• Enables high-precision resistance trimming to meet exact specifications
• Enhances quality assurance by allowing in-process measurement and adjustment
• Can lead to cost savings by reducing errors and rework in electronic production

Technical Classifications (CPCs)

Inventors & Applicants

Patent Abstract

A method of manufacturing an electric circuit includes: providing a signal conductor on a first side of a substrate; providing a resistor structure on the first side of the substrate, the resistor structure contacting the signal conductor; providing a first contacting structure on the first side of the substrate, the first contacting structure electrically connected to the resistor structure by a first electric connection, the first electric connection at least partially provided on the second side of the substrate; applying a test signal to the resistor structure via a measurement circuit contacting the first contacting structure and the signal conductor; determining at least one characteristic property of the first resistor structure based on the test signal; and trimming the resistor structure until the at least one characteristic property has a predefined nominal value or is less than a predefined nominal value by less than a predefined threshold.