A Single Layer 3d Tracking Semiconductor Detector
Simple SummaryContent extracted from patent full text and abstract with AI.
This patent describes a novel pixel detector that uses a single semiconductor sensor layer to extract three-dimensional (3D) information about particle trajectories. By connecting neighboring read-out circuits with relative timing circuits, the detector can determine the z-coordinate (depth information) of charge generation events without needing a fast global clock or multiple stacked layers. This enables efficient 3D particle tracking in a compact, low-power device.
Use CasesContent extracted from patent full text and abstract with AI.
- Medical imaging, particularly in SPECT devices for nuclear medicine using Compton cameras
- Radiation monitoring and safety, such as monitoring for radioactive contamination or decommissioning of nuclear power plants
- Hadron therapy and proton therapy beam monitoring in cancer treatment facilities
- Neutron imaging for security applications and material analysis
- Astrophysical X-ray and gamma-ray polarimetry, such as satellite instruments investigating celestial photon sources
- Research labs tracking high-energy and low-energy particle trajectories in physics experiments
BenefitsContent extracted from patent full text and abstract with AI.
- Enables true 3D particle trajectory reconstruction using a single semiconductor layer, avoiding the need for multiple stacked detectors
- Reduces power consumption by eliminating the need for a fast global clock—timing information is derived using localized relative circuits
- Compact and robust design, making it suitable for portable or space-constrained applications
- Improves accuracy and resolution in imaging and tracking applications due to enhanced depth (Z-axis) information
- May simplify or enhance Compton camera designs, potentially allowing the omission of certain detector layers and reducing required patient dose in medical applications
- Versatile in material choices (e.g., Si, Ge, CdTe, GaAs, diamond), allowing adaptation to different radiation types and energy ranges
Technical Classifications (CPCs)
Main Classifications
Electrical & Electronic Tech
Physics & Measurement
Sub Classifications
Measuring & Testing
Semiconductor & Solid-State Devices
CPC Codes
Inventors & Applicants
Applicants
Cern European Organization Nuclear Research
Univ Friedrich Alexander Er
Czech Technical University in Prague Inst of Ex and Applied Physics
Campbell Michael
Michel Thilo
Jakubek Jan
Patent Abstract
The present invention relates to a pixel detector (10), comprising a semiconductor sensor layer (12), in which charges can be generated upon interaction with particles to be detected. The semiconductor layer defines an X-Y-plane and has a thickness extending in Z-direction. The detector further comprises a read-out electronics layer (14) connected to said semiconductor layer (12), said read-out electronics layer (14) comprising an array of read-out circuits (20) for detecting signals indicative of charges generated in a corresponding volume of said semiconductor sensor layer (12). The neighbouring read-out circuits (20) are connected by a relative timing circuit configured to determine time difference information between signals detected at said neighbouring read-out circuits (20). The time difference information is indicative of a difference in the Z-components of the locations of charge generations in the corresponding neighbouring sensor volumes caused by a particle trajectory that is inclined with respect to the X-Y-plane.
Key Information
Publication No.
WO2013041114A1
Family ID
44905976
Publication Date
2013-03-28
Application No.
EP2011004733W
Application Date
2011-09-21
Priority Date
2011-09-21
Granted
Yes (3/7)
Possible Cooperation
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