Method for Determining and Correcting Surface Data for Dimensional Measurement with Computed Tomography Sensor Technology
Simple SummaryContent extracted from patent full text and abstract with AI.
This patent describes a method for measuring and correcting the geometric features of a workpiece using computed tomography (CT) sensors. It involves creating a surface model from surface points, simulating radiographic images based on this model, and comparing these simulated images with actual captured radiographic images to identify and correct surface points for more accurate measurements.
Use CasesContent extracted from patent full text and abstract with AI.
- Quality control in manufacturing processes to measure precise dimensions of components
- Medical device inspection where non-destructive, high-accuracy measurement is required
- Reverse engineering of complex parts by accurately capturing their surface geometries
- Inspection of additive-manufactured (3D printed) parts for dimensional accuracy
- Detection of defects or deformations in industrial components using CT imaging
BenefitsContent extracted from patent full text and abstract with AI.
- Improves measurement accuracy by correcting surface data based on actual radiographic images
- Enables non-destructive testing and dimensional measurement of complex objects
- Reduces measurement errors that might occur due to limitations in image capture or modeling
- Automates the correction process, saving time and reducing manual labor
- Can be integrated into automated manufacturing systems for real-time quality control
Technical Classifications (CPCs)
Main Classifications
Physics & Measurement
Sub Classifications
Computing & Calculating
Measuring & Testing
CPC Codes
Inventors & Applicants
Inventors
N/A
Applicants
Deutsches Krebsforsch
Friedrich Alexander Universität Erlangen Nürnberg
Werth Messtechnik Gmbh
Patent Abstract
Die Erfindung bezieht sich auf ein Verfahren zur Bestimmung von geometrischen Merkmalen an einem Werkstück mittels einer Computertomografiesensorik, wobei anhand eines aus Oberflächenpunkten bestehenden Oberflächenmodells simulierte Durchstrahlungsbilder für zumindest einige von aufgenommenen Durchstrahlungsbilder berechnet werden, und aus dem Vergleich der aufgenommenen Durchstrahlungsbilder zu den simulierten Durchstrahlungsbildern korrigierte Oberflächenpunkte ermittelt werden.
Key Information
Publication No.
DE102014103137A1
Family ID
53883856
Publication Date
2015-09-10
Application No.
DE102014103137A
Application Date
2014-03-10
Priority Date
2014-03-10
Granted
No
Possible Cooperation
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