Device for examining permittivity of e.g. metallic, anisotropic two-layer dielectric sheet in non-destructive testing area, has processing unit for spatially-resolving image of object by changing focusing point from reflected signals

Simple SummaryContent extracted from patent full text and abstract with AI.

This patent describes a device that uses polarized millimeter wave signals to examine the permittivity of materials, such as metallic or anisotropic two-layer dielectric sheets, without causing any damage. The system uses a specialized transmitter and receiver arranged as a two-dimensional antenna array, which creates spatially-resolved images of the object by altering the focus based on the reflected signals to detect intensity and phase changes.

Use CasesContent extracted from patent full text and abstract with AI.

• Non-destructive testing of industrial materials, such as metal sheets and composite structures
• Quality control in manufacturing processes involving layered materials
• Inspection of aircraft components for hidden defects without dismantling
• Evaluating building materials for structural integrity in construction
• Research on material properties in laboratories, particularly for new composites or anisotropic substances

BenefitsContent extracted from patent full text and abstract with AI.

• Enables non-destructive examination of materials, preserving the integrity of the tested objects
• Provides spatially-resolved imaging, allowing detailed mapping of material properties and defects
• Can detect both intensity and phase changes, offering comprehensive analysis of material characteristics
• Useful for a wide range of materials, including complex layered or anisotropic structures
• Can be integrated into automated inspection systems for faster and more reliable quality control

Technical Classifications (CPCs)

Inventors & Applicants

Patent Abstract

The device has a transmission unit (11) for transmitting polarized millimeter wave signal to an object (15) under a determined incident angle. A reception unit (12) for detecting intensity and/or a phase position of a reflected signal from the object. The transmission and reception units are arranged in front of the object such that an aperture surface (10) is expanded. The processing unit spatially resolves an image of the object by changing a focusing point (17) from the reflected signals. The transmitting and reception units are designed as a two-dimensional antenna array. An independent claim is also included for a method for examining material properties of an object.