Method for Examining an Object with an X-ray Imaging System for Phase-Contrast Imaging with Stochastic Phase Sampling

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This patent describes a method for examining objects using an X-ray imaging system capable of phase-contrast imaging by employing stochastic (randomized) phase sampling. The technique involves moving certain components of the imaging system relative to each other during exposure and combining multiple partial images taken at different positions to produce a final, high-quality image with enhanced contrast.

Use CasesContent extracted from patent full text and abstract with AI.

• Medical diagnostics for better visualization of soft tissues
• Non-destructive testing and quality control in manufacturing
• Analytical imaging in biological research
• Security and customs screening applications
• Material science for identifying internal structures of materials

BenefitsContent extracted from patent full text and abstract with AI.

• Improves image contrast, especially for soft or low-contrast materials
• Reduces total exposure time by combining multiple partial exposures
• Enables more detailed visualization of internal structures
• Potentially lowers radiation dose compared to traditional methods
• Can be applied in both medical and industrial fields

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Patent Abstract

A method, for examining an object using an X-ray recording system, includes during an X-ray image recording, moving components relative to one another with the lateral displacement by displacement distances. The method includes generating the X-ray image recording during the displacement from n partial images, so that the total exposure time of the X-ray image recording is made up from a sum of partial exposure times. In each of the partial images, the intensity is determined in each pixel. The position of the second component relative to the first component is determined for each recording of the partial images. Finally, the image information is determined from the partial images and the displacements.