Electron Beam Splitter

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The invention is an electron beam splitter that uses a specially designed multi-pole electrode arrangement, powered by high-frequency AC voltage, to adiabatically and nearly losslessly split a single electron beam into two separate beams. At the inlet, the electrodes create an oscillating electric field that traps the electrons in a single channel, while at the outlet, the configuration is changed so that the field splits into two confinement channels, thus dividing the electron beam. The device is optimized for low-energy electrons and is especially beneficial for use in electron microscopy and interferometry.

Use CasesContent extracted from patent full text and abstract with AI.

• Electron microscopy, particularly low-energy electron microscopy (LEEM) for high-resolution imaging with reduced sample damage.
• Electron holography, enabling advanced measurements such as internal potential mapping, layer thickness gauging, and field mapping.
• Quantum interference experiments where precise splitting and manipulation of electron beams are needed.
• Mass spectrometry and ion/electron trapping technologies using advanced beam manipulation.
• Interference lithography for nanoscale patterning based on electron wave splitting.
• Measurement and analysis of coherence properties of electron sources.

BenefitsContent extracted from patent full text and abstract with AI.

• Nearly lossless splitting of electron beams, reducing signal losses compared to conventional splitters.
• Adiabatic beam separation, maintaining electron ground state, which improves measurement fidelity and minimizes energy loss.
• Large and controlled beam separation allows for more flexible experimental setups, particularly for interferometric and holographic systems.
• Enhanced robustness against external disturbances due to the electrode design and operation principle.
• Flat, chip-like modular design allows easy integration and customization in electron microscopes and research setups.
• Reduces radiation dose to samples, making it suitable for sensitive biological specimens and other applications where sample damage is a concern.

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Inventors & Applicants

Patent Abstract

The invention relates to an electron beam splitter (1) comprising a multi-pole electrode arrangement (5) which can be supplied with a high-frequency AC voltage and which extends along a specified path (6) from an inlet side (9) to an outlet side (10). The electrode arrangement (5) generates a first oscillating electric field (61) at the inlet side (9) by means of a first number of electrodes (7) supplied with a voltage, said electric field forming a single local confinement minimum (62) on a transversal plane in a time-averaged manner, and the electrode arrangement (5) generates a second oscillating electric field (65) at least at the outlet side (10) by means of a second number of electrodes (7) supplied with a voltage, said electric field forming at least two local confinement minima (66, 67) on a transversal plane in a time-averaged manner.