Method for Examining an Object with an X-ray Imaging System for Phase-Contrast Imaging with Displacement Measurement

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This patent describes a method for examining objects using an X-ray system optimized for phase-contrast imaging. The technique involves precisely aligning and laterally moving components within the X-ray setup during imaging, capturing both reference and measurement images to enhance the resulting phase-contrast image quality. The process calculates displacement and phase data using selected pixel intensity information to assemble a final, detailed image.

Use CasesContent extracted from patent full text and abstract with AI.

• Medical imaging for improved soft tissue visualization
• Non-destructive testing in industrial inspections
• Material science research where fine structural contrasts are needed
• Biological specimen imaging for research
• Quality assurance in manufacturing of complex components

BenefitsContent extracted from patent full text and abstract with AI.

• Enables enhanced phase-contrast X-ray images, revealing details not visible with conventional methods
• Provides more accurate displacement and phase information for improved image reconstruction
• Allows for non-invasive, detailed examination of soft tissues and delicate structures
• Reduces the need for contrast agents or invasive procedures in medical imaging
• Can be adapted for a range of objects and uses beyond traditional medical X-rays

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Patent Abstract

A method, for examining an object using an X-ray recording system, includes aligning the object in the X-ray beam and the X-ray recording system with one another such that regions in the X-ray beam are uncovered for measurement of a free field. During an X-ray image recording, the components are moved relative to one another with a lateral displacement. In a position of the relative lateral displacement of the components, a reference image containing free fields is recorded. The X-ray image recording is generated from partial images during the displacement and the position of the second component relative to the first component is determined for each partial recording such that the displacement distances of the displacements and the reference phases are calculated from a selected set of pixels and the measured intensity values thereof. Finally, the image information is determined from the partial images, the displacements and the reference phases.