Computer-implemented Method for Automatically Classifying Emitter Structures, Device for Carrying Out the Method, Machine-Readable Program Code and Storage Medium

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This patent discloses a computer-implemented method, device, software, and storage medium for automatically classifying emitter structures used to emit electrons for X-ray generation. The system uses images created by combining bright-field and dark-field microscopy images (fusion images) of the emitters. These fusion images are analyzed by a trained artificial neural network (such as a convolutional neural network) to classify the emitters as either defect-free or defective. Detailed identification of specific defect types is possible, and the system can be implemented both locally and remotely (e.g., via the cloud).

Use CasesContent extracted from patent full text and abstract with AI.

• Quality inspection during the manufacturing process of electron emitters for X-ray tubes, ensuring only defect-free emitters are used.
• Automated, high-throughput screening of emitter structures in industrial production lines for medical imaging or material analysis equipment.
• Remote/cloud-based inspection to allow specialists to analyze emitters in different locations without being physically present.
• Failure analysis and diagnostics for X-ray generating devices or electron emitters.
• Research and development to optimize manufacturing parameters by tracking defect types and locations.

BenefitsContent extracted from patent full text and abstract with AI.

• Provides rapid, objective, and automated defect detection and classification, reducing reliance on manual inspection.
• Capable of more consistent and accurate identification of defects and specific defect types than human inspectors.
• Enables full inspection of all manufactured parts, improving overall device reliability.
• Supports both local (on-site) and remote (cloud-based) implementations, increasing flexibility and scalability.
• Facilitates productivity improvements, cost reduction, and higher quality assurance in the manufacturing of emitters for X-ray and related devices.

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Patent Abstract

At least one example embodiment relates to an apparatus, machine-readable program code, a storage medium and computer-implemented method for the automatic classification of emitter structures embodied to emit electrons for the generation of X-rays, wherein the classification takes place on the basis of a reference image of an emitter structure, wherein the classification comprises a first class and at least one second class, wherein the first class corresponds to a substantially defect-free emitter structure and the at least one second class corresponds to a defective emitter structure. Since, for the classification, an image embodied as a fusion image from a bright-field image and a dark-field image is referred to and the classification of the emitter structure into the first and the second class takes place on the basis of this image, improved defect checking of emitter structures can be provided.