Apparatus and Method for Calibrating Measuring Instruments
Simple SummaryContent extracted from patent full text and abstract with AI.
This invention provides an apparatus and method for calibrating measuring instruments, particularly spectrometers and spectrophotometers, using a reference light source generated via parametric down-conversion (PDC) in a nonlinear crystal. By generating a light spectrum with precisely known properties through physical laws, the invention enables accurate calibration of the sensitivity (response function) of measurement devices across a wide wavelength range. The process involves irradiating a nonlinear crystal with a laser, tuning the phase-matching conditions, capturing spectra, and deriving calibration data based on known theoretical spectra.
Use CasesContent extracted from patent full text and abstract with AI.
- Calibration of laboratory spectrometers and spectrophotometers for accurate scientific measurements.
- Calibration of optical instruments in medical diagnostics or clinical laboratories (e.g., for detecting biomolecular spectra).
- Quality control in industrial applications, such as semiconductor manufacturing, that rely on precise spectral measurements.
- Calibration of environmental monitoring devices measuring pollutant spectra or atmospheric gases.
- Research in photonics, quantum optics, and materials where accurate instrument calibration is necessary for reliable data.
BenefitsContent extracted from patent full text and abstract with AI.
- Provides a stable, physics-based reference light spectrum for calibration, reducing reliance on aging or expensive standard lamps.
- Enables accurate, repeatable, and broad-wavelength coverage calibration, improving trust in measurement results.
- Reduces time and costs associated with recalibrating conventional standard light sources, which may degrade or require external certification.
- Improves the reliability and traceability of spectroscopic measurements in scientific, industrial, and medical applications.
- Facilitates high-precision research and analysis where minute spectral differences matter.
Technical Classifications (CPCs)
Main Classifications
Physics & Measurement
Sub Classifications
Measuring & Testing
CPC Codes
Inventors & Applicants
Applicants
Univ Ottawa
Max Planck Gesellschaft
Univ Friedrich Alexander Er
Patent Abstract
A method and apparatus is provided for implementing a parametric down-conversion (PDC)-based calibration comprising calibrating a measuring instrument; disposing a pinhole at a position of a light-emitting sample for which the measuring instrument needs to be calibrated; irradiating a nonlinear crystal with a light source; setting the nonlinear crystal by ensuring a phase-matching wavelength of the nonlinear crystal is set at one boundary of a desired bandwidth; acquiring one or more PDC spectrums by the measuring instrument; obtaining peak values and their corresponding wavelengths from each acquired spectrum; and obtaining a response function based on the peak values and corresponding wavelengths.
Key Information
Publication No.
WO2018073749A1
Family ID
62019177
Publication Date
2018-04-26
Application No.
IB2017056450W
Application Date
2017-10-17
Priority Date
2016-10-17
Granted
Yes (2/7)
Possible Cooperation
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