Method for Reducing Image Artifacts

Simple SummaryContent extracted from patent full text and abstract with AI.

This invention describes a method for reducing image artifacts, such as those caused by beam hardening, in X-ray imaging. By acquiring multiple X-ray projections from different angles and using a correction model that considers consistency across these projections, the process effectively minimizes unwanted artifacts, resulting in clearer and more accurate images.

Use CasesContent extracted from patent full text and abstract with AI.

• Medical imaging, such as CT scans and X-ray diagnostics, to produce clearer images for better diagnoses
• Non-destructive testing in industrial applications, for inspecting materials or structures without damaging them
• Security screening systems using X-ray scanning, such as in airports or customs, for improved image reliability
• Scientific imaging applications where artifact-free X-ray images are required

BenefitsContent extracted from patent full text and abstract with AI.

• Improves the quality and accuracy of X-ray images by reducing artifacts
• Enables more reliable diagnoses and assessments in medical and industrial settings
• Reduces the need for repeat scans, lowering radiation exposure for patients or operators
• Enhances the effectiveness of automated or computer-aided image analysis systems

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Inventors & Applicants

Patent Abstract

A method for reducing image artifacts caused, for example, by beam hardening includes acquiring at least two projections of a transirradiated object are acquired from different perspectives by an X-ray emitter and an X-ray detector defining a projection plane. A correction model that is linear in parameters and is valid for the at least two projections is determined. At least two epipolar lines corresponding to a common epipolar plane are identified in the projection planes of the at least two projections. The parameters of the correction model are determined by optimization, taking account of data terms that are independent of the parameters. The data terms quantify a consistency condition of the at least two projections that applies to the epipolar lines. Artifact-reduced image data is determined based on the determined parameters.