Optical Measuring Arrangement and Optical Measuring Method
Simple SummaryContent extracted from patent full text and abstract with AI.
This invention discloses an optical measurement arrangement and method for contactless scanning and detection of surfaces, treatment zones, and process areas on workpieces. It employs one or more sensors that use the principle of dividing incident electromagnetic radiation into diffracted and reflected components at a specially designed optical interface. This setup allows for precise, non-contact measurement of the position and characteristics of illuminated spots and emission sources, such as those found in laser processing or quality control environments.
Use CasesContent extracted from patent full text and abstract with AI.
- Process monitoring and quality assurance in laser material processing systems
- Contactless inspection or measurement of the position and area of illuminated spots on industrial workpieces
- Monitoring and controlling industrial manufacturing processes like welding or cutting
- Surface measurement in laboratory or field metrology applications
- Real-time diagnostics in automated manufacturing lines for process control
- Inspection of flames, plasma, or bright spots in burner or furnace applications
- Optical alignment and calibration in optical system integration
BenefitsContent extracted from patent full text and abstract with AI.
- Provides non-contact, high-precision measurement, reducing the risk of damage to sensitive components
- Works at a distance, enabling remote monitoring of hazardous or inaccessible environments
- Insensitive to fluctuations in absolute light intensity, leading to reliable and repeatable measurements
- Modular and adaptable for different measurement requirements by adjusting sensor geometry and setup
- Enables multi-dimensional (3D) sensing of emission source positions through the combination of multiple sensors
- Improves process stability and quality through accurate real-time feedback
- Can be integrated with existing process automation and quality assurance systems
Technical Classifications (CPCs)
Main Classifications
Physics & Measurement
Sub Classifications
Measuring & Testing
CPC Codes
Inventors & Applicants
Applicants
Univ Friedrich Alexander Er
Dietrich Simon
Hohenstein Ralph
Otto Andreas
Patent Abstract
The invention relates to an optical measuring arrangement (10) for the contactless optical scanning and/or detection of surfaces and/or treatment zones of workpieces and/or processes. The optical measuring arrangement (10) comprises at least one angle of incidence sensor (30) which is positioned in the beam path of electromagnetic radiation emitted by a measuring point (12) or emission source. Said angle of incidence sensor (30) has at least one body (26) which is arranged in the beam path of the electromagnetic radiation emitted by the measuring point (12) or the radiation emission source and is at least partly permeable to the electromagnetic radiation. The optical angle of incidence sensor (30) comprises at least one exit point acting as an interface (6) for splitting up the electromagnetic radiation into diffracted and reflected portions of the electromagnetic radiation.
Key Information
Publication No.
WO2010063521A2
Family ID
42174229
Publication Date
2010-06-10
Application No.
EP2009064293W
Application Date
2009-10-29
Priority Date
2008-12-05
Granted
No
Possible Cooperation
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